| 國立臺灣科技大學 |
2005 |
Capability measure for asymmetric tolerances non-normal processes applied to speaker driver manufacturing
|
Pearn, W. L. ; Wu, Chien-Wei; Wang, K. H. |
| 國立臺灣科技大學 |
2005 |
Measuring manufacturing capability for couplers and wavelength division multiplexers
|
Wu, Chien-Wei; Pearn, W. L. |
| 國立臺灣科技大學 |
2005 |
Bootstrap approach for estimating process quality yield with application to light emitting diodes
|
Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
Procedures for testing manufacturing precision Cp based on (Xbar, R) or (Xbar, S) control chart samples
|
Pearn, W. L. ; Wu, Chien-Wei; Chuang, H. C. |
| 國立臺灣科技大學 |
2005 |
An effective modern approach for measuring high-tech product manufacturing process quality
|
Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
Process capability assessment for index Cpk based on Bayesian approach
|
Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
Capability testing based on Cpm with multiple samples
|
Wu, Chien-Wei; Pearn, W. L. |
| 國立勤益科技大學 |
2004 |
The C”pk index for asymmetric tolerances: Implications and inference
|
Pearn, W.L.; Lin, P.C.; Chen, K.S. |
| 國立勤益科技大學 |
2004 |
The C”pk index for asymmetric tolerances: Implications and inference
|
Pearn, W.L. ; Lin, P.-C. ; Chen, K.-S. |
| 國立勤益科技大學 |
2004 |
Testing process performance based on capability indexCpk with critical values
|
Pearn, W.L. ; Lin, P.-C. |
| 國立臺灣科技大學 |
2004 |
Procedure for supplier selection based on Cpm applied to super twisted nematic liquid crystal display processes
|
Pearn, W. L. ; Wu, Chien-Wei; Lin, H. C. |
| 國立臺灣科技大學 |
2004 |
Quality-yield measure for production with very low fraction of defectives
|
Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2004 |
Distributional and inferential properties of the process loss indices
|
Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
| 大葉大學 |
2003-06 |
Distributional and inferential Properties of the Estimated Precision Cp based on Multiple Samples
|
Pearn, W. L.;Yang, Y. S. |
| 國立勤益科技大學 |
2003 |
Capability Measures For processes With Multiple Characteristics
|
Chen, K.S.; Pearn, W.L.; Lin, P.C. |
| 國立勤益科技大學 |
2003 |
Distributional properties and implications of the estimated process incapability index
|
Lin, P.C. ; Pearn, W.L. ; Chen, K. S. |
| 國立勤益科技大學 |
2002 |
Testing process performance based on the yield: an application to the liquid-crystal display module
|
Chen, Jann-Pygn ; Pearn, W.L. |
| 國立勤益科技大學 |
2002 |
One-sided capability indices Cpu and Cpl: decision making with sample information
|
Pearn, W.L.; Chen, K.S. |
| 國立勤益科技大學 |
2002 |
Testing process capability for one-sided specification limit with application to the voltage level translator
|
Lin, P.-C. ; Pearn, W.L. |
| 國立勤益科技大學 |
2002 |
A Practical Implementation of the Incapability Index Cpp
|
Pearn, W.L. ; Chen, K.L. ; Chen, K.S. |
| 國立勤益科技大學 |
2001 |
Testing process capability using the index Cpmk with an application
|
Pearn, W.L.; Yang, S.L.; Chen, K.S.; Lin, P.C. |
| 國立勤益科技大學 |
2001 |
Estimating process capability index C”pmk asymmetric tolerances: distributional properties
|
Pearn, W.L.; Lin, P.C.; Chen, K.S. |
| 國立勤益科技大學 |
2001 |
Testing process capability using the index Cpmk with an application
|
Pearn, W.L. ; Yang, S.-L. ; Chen, K.-S. ; Lin, P.-C. |
| 國立勤益科技大學 |
2001 |
Estimating process capability index C”pmk for asymmetric tolerances: Distributional properties
|
Pearn, W.L. ; Lin, P.-C. ; Chen, K.-S. |
| 國立勤益科技大學 |
2001 |
Capability indices for processes with asymmetric tolerances
|
Chen, K.S. ; Pearn, W.L. |
