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"pearn w l"
Showing items 156-165 of 182 (19 Page(s) Totally)
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| 國立臺灣科技大學 |
2004 |
Procedure for supplier selection based on Cpm applied to super twisted nematic liquid crystal display processes
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Pearn, W. L. ; Wu, Chien-Wei; Lin, H. C. |
| 國立臺灣科技大學 |
2004 |
Quality-yield measure for production with very low fraction of defectives
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Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2004 |
Distributional and inferential properties of the process loss indices
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Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
| 大葉大學 |
2003-06 |
Distributional and inferential Properties of the Estimated Precision Cp based on Multiple Samples
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Pearn, W. L.;Yang, Y. S. |
| 國立勤益科技大學 |
2003 |
Capability Measures For processes With Multiple Characteristics
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Chen, K.S.; Pearn, W.L.; Lin, P.C. |
| 國立勤益科技大學 |
2003 |
Distributional properties and implications of the estimated process incapability index
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Lin, P.C. ; Pearn, W.L. ; Chen, K. S. |
| 國立勤益科技大學 |
2002 |
Testing process performance based on the yield: an application to the liquid-crystal display module
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Chen, Jann-Pygn ; Pearn, W.L. |
| 國立勤益科技大學 |
2002 |
One-sided capability indices Cpu and Cpl: decision making with sample information
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Pearn, W.L.; Chen, K.S. |
| 國立勤益科技大學 |
2002 |
Testing process capability for one-sided specification limit with application to the voltage level translator
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Lin, P.-C. ; Pearn, W.L. |
| 國立勤益科技大學 |
2002 |
A Practical Implementation of the Incapability Index Cpp
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Pearn, W.L. ; Chen, K.L. ; Chen, K.S. |
Showing items 156-165 of 182 (19 Page(s) Totally)
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