| 國立交通大學 |
2014-12-08T15:15:41Z |
Precision measures for processes with multiple manufacturing lines
|
Pearn, W. L.; Chang, C. S. |
| 國立交通大學 |
2014-12-08T15:15:33Z |
Bayesian approach for measuring EEPROM process capability based on the one-sided indices C-PU and C-PL
|
Wu, Chien-Wei; Pearn, W. L. |
| 國立交通大學 |
2014-12-08T15:15:31Z |
One-sided process capability assessment in the presence of measurement errors
|
Pearn, W. L.; Liao, Mou-Yuan |
| 國立交通大學 |
2014-12-08T15:15:29Z |
Measuring production yield for processes with multiple quality characteristics
|
Pearn, W. L.; Wang, F. K.; Yen, C. H. |
| 國立交通大學 |
2014-12-08T15:15:20Z |
Measuring process performance based on expected loss with asymmetric tolerances
|
Pearn, W. L.; Chang, Y. C.; Wu, Chien-Wei |
| 國立交通大學 |
2014-12-08T15:15:10Z |
Accuracy analysis of the percentile method for estimating non normal manufacturing quality
|
Wu, Chien-Wei; Pearn, W. L.; Chang, C. S.; Chen, H. C. |
| 國立交通大學 |
2014-12-08T15:15:01Z |
On the sampling distributions of the estimated process loss indices with asymmetric tolerances
|
Chang, Y. C.; Pearn, W. L.; Wu, Chien-Wei |
| 國立交通大學 |
2014-12-08T15:15:01Z |
Multivariate capability indices: Distributional and inferential properties
|
Pearn, W. L.; Wang, F. K.; Yen, C. H. |
| 國立交通大學 |
2014-12-08T15:15:01Z |
Optimal management for a finite M/M/R queueing system with two arrival modes
|
Wang, Kuo-Hsiung; Ke, Jyh-Bin; Pearn, W. L. |
| 國立交通大學 |
2014-12-08T15:15:01Z |
A comparison of two methods for transforming non-normal manufacturing data
|
Chung, S. H.; Pearn, W. L.; Yang, Y. S. |
| 國立交通大學 |
2014-12-08T15:15:00Z |
Estimating process yield based on S-pk for multiple samples
|
Pearn, W. L.; Cheng, Ya Ching |
| 國立交通大學 |
2014-12-08T15:14:47Z |
An effective decision making method for product acceptance
|
Pearn, W. L.; Wu, Chien-Wei |
| 國立交通大學 |
2014-12-08T15:14:22Z |
Scheduling integrated circuit assembly operations on die bonder
|
Pearn, W. L.; Chung, S. H.; Lai, C. M. |
| 國立交通大學 |
2014-12-08T15:14:10Z |
Due-date assignment for wafer fabrication under demand variate environment
|
Pearn, W. L.; Chung, S. H.; Lai, C. A. |
| 國立交通大學 |
2014-12-08T15:13:35Z |
Measuring process capability based on Cpmk with gauge measurement errors
|
Hsu, B. M.; Shu, M. H.; Pearn, W. L. |
| 國立交通大學 |
2014-12-08T15:13:35Z |
Optimal tool replacement for processes with low fraction defective
|
Pearn, W. L.; Hsu, Ya-Chen |
| 國立交通大學 |
2014-12-08T15:13:32Z |
Tool replacement policy for one-sided processes with low fraction defective
|
Pearn, W. L.; Hsu, Y-C; Shiau, J-J Horng |
| 國立交通大學 |
2014-12-08T15:13:19Z |
Estimating and testing process precision with presence of gauge measurement errors
|
Pearn, W. L.; Liao, Mou-Yuan |
| 國立交通大學 |
2014-12-08T15:13:11Z |
Optimal control of an M/G/1/K queueing system with combined F policy and startup time
|
Wang, K.-H.; Kuo, C.-C.; Pearn, W. L. |
| 國立交通大學 |
2014-12-08T15:13:01Z |
Testing process precision for truncated normal distributions
|
Pearn, W. L.; Hung, H. N.; Peng, N. F.; Huang, C. Y. |
| 國立交通大學 |
2014-12-08T15:12:55Z |
Bootstrap approach for supplier selection based on production yield
|
Wu, C. -W.; Shu, M. H.; Pearn, W. L.; Liu, K. H. |
| 國立交通大學 |
2014-12-08T15:12:41Z |
A variables sampling plan based on C-pmk for product acceptance determination
|
Wu, Chien-Wei; Pearn, W. L. |
| 國立交通大學 |
2014-12-08T15:12:05Z |
Decision-making in a single-period inventory environment with fuzzy demand
|
Su, Rung-Hung; Yang, Dong-Yuh; Pearn, W. L. |
| 國立交通大學 |
2014-12-08T15:11:26Z |
A recursive method for the F-policy G/M/1/K queueing system with an exponential startup time
|
Wang, Kuo-Hsiung; Kuo, Ching-Chang; Pearn, W. L. |
| 國立交通大學 |
2014-12-08T15:10:35Z |
Capability adjustment or gamma processes with mean shift consideration in implementing Six Sigma program
|
Hsu, Ya-Chen; Pearn, W. L.; Wu, Pei-Ching |
| 國立交通大學 |
2014-12-08T15:10:25Z |
A comparison of methods for estimating loss-based capability index
|
Wu, Chien-Wei; Shu, Ming-Hung; Pearn, W. L.; Cheng, Feng-Tsung |
| 國立交通大學 |
2014-12-08T15:10:15Z |
An Improved Approach for Estimating Product Performance Based on the Capability Index C(pmk)
|
Pearn, W. L.; Yang, Dong-Yuh; Cheng, Ya-Ching |
| 國立交通大學 |
2014-12-08T15:10:14Z |
Select better suppliers based on manufacturing precision for processes with multivariate data
|
Yen, C. H.; Pearn, W. L. |
| 國立交通大學 |
2014-12-08T15:10:14Z |
Minimising makespan on parallel batch processing machines with non-identical ready time and arbitrary job sizes
|
Chung, S. H.; Tai, Y. T.; Pearn, W. L. |
| 國立交通大學 |
2014-12-08T15:10:05Z |
An overview of theory and practice on process capability indices for quality assurance
|
Wu, Chien-Wei; Pearn, W. L.; Kotz, Samuel |
| 國立交通大學 |
2014-12-08T15:09:13Z |
An Effective Scheduling Approach for Maximizing Polyimide Printing Weighted Throughput in Cell Assembly Factories
|
Chung, S. H.; Tai, Y. T.; Pearn, W. L. |
| 國立交通大學 |
2014-12-08T15:09:13Z |
Statistical Approach for Cycle Time Estimation in Semiconductor Packaging Factories
|
Pearn, W. L.; Tai, Yu-Ting; Lee, J. H. |
| 國立交通大學 |
2014-12-08T15:09:11Z |
Fast and effective algorithms for the liquid crystal display module (LCM) scheduling problem with sequence-dependent setup time
|
Chung, S. H.; Pearn, W. L.; Tai, Y. T. |
| 國立交通大學 |
2014-12-08T15:09:02Z |
Photolithography Control in Wafer Fabrication Based on Process Capability Indices With Multiple Characteristics
|
Pearn, W. L.; Kang, H. Y.; Lee, A. H. -I.; Liao, M. Y. |
| 國立交通大學 |
2014-12-08T15:09:02Z |
Sample size determination for production yield estimation with multiple independent process characteristics
|
Hsu, Ya-Chen; Pearn, W. L.; Chuang, Ya-Fei |
| 國立交通大學 |
2014-12-08T15:07:43Z |
Procedure of the convolution method for estimating production yield with sample size information
|
Pearn, W. L.; Hung, Hui Nien; Cheng, Ya Ching; Lin, Gu Hong |
| 國立交通大學 |
2014-12-08T15:07:43Z |
Measuring production yield for processes with multiple characteristics
|
Pearn, W. L.; Cheng, Ya-Ching |
| 國立交通大學 |
2014-12-08T15:07:07Z |
Process Selection for Higher Production Yield Based on Capability Index S(pk)
|
Lin, Chen-ju; Pearn, W. L. |
| 國立交通大學 |
2014-12-08T15:07:06Z |
Measuring Manufacturing Yield for Gold Bumping Processes Under Dynamic Variance Change
|
Pearn, W. L.; Tai, Y. T.; Chiang, W. L. |
| 國立交通大學 |
2014-12-08T15:06:52Z |
Comparison of two randomized policy M/G/1 queues with second optional service, server breakdown and startup
|
Wang, Kuo-Hsiung; Yang, Dong-Yuh; Pearn, W. L. |
| 國立臺灣科技大學 |
2011 |
Two Tests for Supplier Selection Based on Process Yield
|
Pearn, W.L.;Liao, M.Y.;Wu, C.W.;Chu, Y.T. |
| 國立臺灣科技大學 |
2010 |
Estimating and testing process accuracy with extension to asymmetric tolerances
|
Wu, Chien-Wei; Shu, M. H. ; Pearn, W. L. ; Tai, Y. C. |
| 國立臺灣科技大學 |
2009 |
An overview of theory and practice on process capability indices for quality assurance
|
Wu, Chien-Wei; Pearn, W. L. ; Kotz, S. |
| 國立臺灣科技大學 |
2009 |
A comparison of methods for estimating loss-based capability index
|
Wu, Chien-Wei; Shu, M. H. ; Pearn, W. L. ; Cheng, F. T. |
| 元培科技大學 |
2009 |
Sample size determination for production yield estimation with multiple independent process characteristics
|
Hsu, Ya Chen; Pearn, W. L.; Ya Fei Chuang |
| 國立高雄應用科技大學 |
2008 |
Bootstrap approach for supplier selection based on production yield
|
蘇明鴻; WU, C.-W.; SHU, M. H.; PEARN, W. L.; LIU, K. H. |
| 國立聯合大學 |
2008 |
Solution strategies for multi-stage wafer probing scheduling problem with reentry
|
Pearn, W.L. ; Chung, S.H.; Yang, M.H.; Shiao, K.P. |
| 國立臺灣科技大學 |
2008 |
A variables sampling plan based on Cpmk for product acceptance determination
|
Wu, Chien-Wei; Pearn, W. L. |
| 國立臺灣科技大學 |
2008 |
Bootstrap approach for supplier selection based on production yield
|
Wu, Chien-Wei; Shu, M. H. ; Pearn, W. L. ; Liu, K. H. |
| 元培科技大學 |
2008 |
Capability Adjustment for Gamma Processes with Mean Shift Consideration in Implementing Six Sigma Program
|
Hsu, Ya Chen; Pearn, W. L.; Pei Ching Wu |
