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Showing items 31-55 of 91  (4 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-08T15:40:33Z An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators (vol 43, pg 495, 2003) Pearn, WL; Shu, MH
國立交通大學 2014-12-08T15:40:32Z On the Maximum Benefit Chinese Postman Problem Pearn, WL; Wang, KH
國立交通大學 2014-12-08T15:40:12Z Lower confidence bounds with sample size information for C-pm applied to production yield assurance Pearn, WL; Shu, MH
國立交通大學 2014-12-08T15:40:08Z Distributional and inferential properties of the estimated precision C-p based on multiple samples Pearn, WL; Yang, YS
國立交通大學 2014-12-08T15:40:07Z Cost benefit analysis of series systems with warm standby components Wang, KH; Pearn, WL
國立交通大學 2014-12-08T15:39:50Z Measuring process yield based on the capability index C-pm Pearn, WL; Lin, PC
國立交通大學 2014-12-08T15:39:50Z Measuring manufacturing capability based on lower confidence bounds of C-pmk applied to current transmitter process Pearn, WL; Shu, MH
國立交通大學 2014-12-08T15:39:46Z The C ''(pk) index for asymmetric tolerances: Implications and inference Pearn, WL; Lin, PC; Chen, KS
國立交通大學 2014-12-08T15:39:41Z Normal approximation to the distribution of the estimated yield index S-pk Pearn, WL; Lin, GH; Wang, KH
國立交通大學 2014-12-08T15:39:31Z Sensitivity analysis of the optimal management policy for a queuing system with a removable and non-reliable server Pearn, WL; Ke, JC; Chang, YC
國立交通大學 2014-12-08T15:39:20Z A case study on the multistage IC final testing scheduling problem with reentry Pearn, WL; Chung, SH; Chen, AY; Yang, MH
國立交通大學 2014-12-08T15:39:16Z C-pm MPPAC for manufacturing quality control applied to precision voltage reference process Pearn, WL; Shu, MH; Hsu, BM
國立交通大學 2014-12-08T15:39:09Z On the distributional properties of the estimated process accuracy index C-a Lin, GH; Pearn, WL
國立交通大學 2014-12-08T15:39:06Z Accuracy analysis of the estimated process treld based onS(pk) Pearn, WL; Chuang, CC
國立交通大學 2014-12-08T15:39:04Z Optimal management of the N-policy M/E-k/1 queuing system with a removable service station: a sensitivity investigation Pearn, WL; Chang, YC
國立交通大學 2014-12-08T15:38:57Z Lower confidence bounds for C-PU and C-PL based on multiple samples with application to production yield assurance Pearn, WL; Shu, MH; Hsu, BM
國立交通大學 2014-12-08T15:38:52Z C-pm MPPAC for manufacturing quality control applied to the precision voltage reference process Pearn, WL; Shu, MH; Hsu, BM
國立交通大學 2014-12-08T15:38:50Z Procedure for supplier selection based on C-pm applied to super twisted nematic liquid crystal display processes Pearn, WL; Wu, CW; Lin, HC
國立交通大學 2014-12-08T15:37:25Z Distributional and inferential properties of the process loss indices Pearn, WL; Chang, YC; Wu, CW
國立交通大學 2014-12-08T15:37:20Z Algorithms for the wafer probing scheduling problem with sequence-dependent set-up time and due date restrictions Pearn, WL; Chung, SH; Yang, MH; Chen, YH
國立交通大學 2014-12-08T15:37:14Z Quality-yield measure for production processes with very low fraction defective Pearn, WL; Chang, YC; Wu, CW
國立交通大學 2014-12-08T15:37:13Z Testing process performance based on capability index C-pk with critical values Pearn, WL; Lin, PC
國立交通大學 2014-12-08T15:36:51Z Bootstrap approach for estimating process quality yield with application to light emitting diodes Pearn, WL; Chang, YC; Wu, CW
國立交通大學 2014-12-08T15:36:51Z Procedures for testing manufacturing precision C(p)based on ((X)over-bar, R) or ((X)over-bar, S) control chart samples Pearn, WL; Wu, CW; Chuang, HC
國立交通大學 2014-12-08T15:36:50Z Capability measure for asymmetric tolerance non-normal processes applied to speaker driver manufacturing Pearn, WL; Wu, CW; Wang, KH

Showing items 31-55 of 91  (4 Page(s) Totally)
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