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Showing items 36-45 of 91  (10 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-08T15:39:50Z Measuring process yield based on the capability index C-pm Pearn, WL; Lin, PC
國立交通大學 2014-12-08T15:39:50Z Measuring manufacturing capability based on lower confidence bounds of C-pmk applied to current transmitter process Pearn, WL; Shu, MH
國立交通大學 2014-12-08T15:39:46Z The C ''(pk) index for asymmetric tolerances: Implications and inference Pearn, WL; Lin, PC; Chen, KS
國立交通大學 2014-12-08T15:39:41Z Normal approximation to the distribution of the estimated yield index S-pk Pearn, WL; Lin, GH; Wang, KH
國立交通大學 2014-12-08T15:39:31Z Sensitivity analysis of the optimal management policy for a queuing system with a removable and non-reliable server Pearn, WL; Ke, JC; Chang, YC
國立交通大學 2014-12-08T15:39:20Z A case study on the multistage IC final testing scheduling problem with reentry Pearn, WL; Chung, SH; Chen, AY; Yang, MH
國立交通大學 2014-12-08T15:39:16Z C-pm MPPAC for manufacturing quality control applied to precision voltage reference process Pearn, WL; Shu, MH; Hsu, BM
國立交通大學 2014-12-08T15:39:09Z On the distributional properties of the estimated process accuracy index C-a Lin, GH; Pearn, WL
國立交通大學 2014-12-08T15:39:06Z Accuracy analysis of the estimated process treld based onS(pk) Pearn, WL; Chuang, CC
國立交通大學 2014-12-08T15:39:04Z Optimal management of the N-policy M/E-k/1 queuing system with a removable service station: a sensitivity investigation Pearn, WL; Chang, YC

Showing items 36-45 of 91  (10 Page(s) Totally)
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