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"pearn wl"
Showing items 51-60 of 91 (10 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:37:14Z |
Quality-yield measure for production processes with very low fraction defective
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Pearn, WL; Chang, YC; Wu, CW |
| 國立交通大學 |
2014-12-08T15:37:13Z |
Testing process performance based on capability index C-pk with critical values
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Pearn, WL; Lin, PC |
| 國立交通大學 |
2014-12-08T15:36:51Z |
Bootstrap approach for estimating process quality yield with application to light emitting diodes
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Pearn, WL; Chang, YC; Wu, CW |
| 國立交通大學 |
2014-12-08T15:36:51Z |
Procedures for testing manufacturing precision C(p)based on ((X)over-bar, R) or ((X)over-bar, S) control chart samples
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Pearn, WL; Wu, CW; Chuang, HC |
| 國立交通大學 |
2014-12-08T15:36:50Z |
Capability measure for asymmetric tolerance non-normal processes applied to speaker driver manufacturing
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Pearn, WL; Wu, CW; Wang, KH |
| 國立交通大學 |
2014-12-08T15:36:50Z |
Measuring manufacturing capability for couplers and wavelength division multiplexers
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Wu, CW; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:36:10Z |
Process capabitity assessment for index C-pk based on bayesian approach
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Pearn, WL; Wu, CW |
| 國立交通大學 |
2014-12-08T15:34:57Z |
Capability testing based on CPM with multiple samples
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Wu, CW; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:34:50Z |
A linear programming model for the control wafers downgrading problem
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Chung, SH; Pearn, WL; Kang, HY |
| 國立交通大學 |
2014-12-08T15:19:28Z |
Control wafers inventory management in the wafer fabrication photolithography area
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Chung, SH; Pearn, WL; Kang, HY |
Showing items 51-60 of 91 (10 Page(s) Totally)
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