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"pearn wl"的相关文件
显示项目 1-25 / 91 (共4页)
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| 國立交通大學 |
2019-04-02T06:00:17Z |
Testing process performance based on capability index C-pk with critical values
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Pearn, WL; Lin, PC |
| 國立交通大學 |
2019-04-02T05:58:59Z |
New generalization of process capability index C-pk
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Pearn, WL; Chen, KS |
| 國立交通大學 |
2014-12-12T01:31:52Z |
具有第二次可選擇服務、服務者選擇休假之多個服務者排隊分析
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巫佳煌; Wu, Chia Huang; 彭文理; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:47:25Z |
Improved solutions for the traveling purchaser problem
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Pearn, WL; Chien, RC |
| 國立交通大學 |
2014-12-08T15:47:16Z |
New generalization of process capability index C-pk
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Pearn, WL; Chen, KS |
| 國立交通大學 |
2014-12-08T15:46:26Z |
Making decisions in assessing process capability index C-pk
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Pearn, WL; Chen, KS |
| 國立交通大學 |
2014-12-08T15:46:25Z |
Improved solutions for the Chinese postman problem on mixed networks
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Pearn, WL; Chou, JB |
| 國立交通大學 |
2014-12-08T15:45:51Z |
Estimating capability index C-pk for processes with asymmetric tolerances
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Pearn, WL; Lin, GH |
| 國立交通大學 |
2014-12-08T15:44:18Z |
Estimating process capability index C"(pmk) for asymmetric tolerances: Distributional properties
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Pearn, WL; Lin, PC; Chen, KS |
| 國立交通大學 |
2014-12-08T15:43:40Z |
On the reliability of the estimated incapability index
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Pearn, WL; Lin, GH |
| 國立交通大學 |
2014-12-08T15:43:28Z |
Capability indices for processes with asymmetric tolerances
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Chen, KS; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:43:00Z |
A case study on the wafer probing scheduling problem
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Pearn, WL; Chung, SH; Yang, MH |
| 國立交通大學 |
2014-12-08T15:42:49Z |
Minimizing the total machine workload for the wafer probing scheduling problem
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Pearn, WL; Chung, SH; Yang, MH |
| 國立交通大學 |
2014-12-08T15:42:45Z |
On the distribution of the estimated process yield index S-pk
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Lee, JC; Hung, HN; Pearn, WL; Kueng, TL |
| 國立交通大學 |
2014-12-08T15:42:45Z |
Estimated incapability index: Reliability and decision making with sample information
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Pearn, WL; Lin, GH |
| 國立交通大學 |
2014-12-08T15:42:16Z |
Computer program for calculating the p-value in testing process capability index C-pmk
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Pearn, WL; Lin, PC |
| 國立交通大學 |
2014-12-08T15:42:13Z |
A multiprocess performance analysis chart based on the incapability index C-pp: an application to the chip resistors
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Pearn, WL; Ko, CH; Wang, KH |
| 國立交通大學 |
2014-12-08T15:42:07Z |
Testing process performance based on the yield: an application to the liquid-crystal display module
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Chen, JP; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:42:05Z |
The wafer probing scheduling problem (WPSP)
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Pearn, WL; Chung, SH; Yang, MH |
| 國立交通大學 |
2014-12-08T15:41:44Z |
A note on the interval estimation of C-pk with asymmetric tolerances
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Lin, GH; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:41:42Z |
A practical implementation of the incapability index C-pp
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Pearn, WL; Chen, KL; Chen, KS |
| 國立交通大學 |
2014-12-08T15:41:41Z |
Maximum entropy analysis to the N policy M/G/1 queueing system with a removable server
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Wang, KH; Chuang, SL; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:41:39Z |
Testing process capability for one-sided specification limit with application to the voltage level translator
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Lin, PC; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:41:27Z |
Job order releasing and throughput planning for multi-priority orders in wafer fabs
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Chung, SH; Pearn, WL; Lee, AHI; Ke, WT |
| 國立交通大學 |
2014-12-08T15:41:25Z |
A Bayesian-like estimator of the process capability index C-pmk
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Pearn, WL; Lin, GH |
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