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教育部委托研究计画 计画执行:国立台湾大学图书馆
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"pearn wl"的相关文件
显示项目 56-65 / 91 (共10页)
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| 國立交通大學 |
2014-12-08T15:36:50Z |
Measuring manufacturing capability for couplers and wavelength division multiplexers
|
Wu, CW; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:36:10Z |
Process capabitity assessment for index C-pk based on bayesian approach
|
Pearn, WL; Wu, CW |
| 國立交通大學 |
2014-12-08T15:34:57Z |
Capability testing based on CPM with multiple samples
|
Wu, CW; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:34:50Z |
A linear programming model for the control wafers downgrading problem
|
Chung, SH; Pearn, WL; Kang, HY |
| 國立交通大學 |
2014-12-08T15:19:28Z |
Control wafers inventory management in the wafer fabrication photolithography area
|
Chung, SH; Pearn, WL; Kang, HY |
| 國立交通大學 |
2014-12-08T15:19:20Z |
Analytic network process (ANP) approach for product mix planning in semiconductor fabricator
|
Chung, SH; Lee, AHI; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:19:05Z |
Assessing process performance based on the incapability index C-pp
|
Lin, PC; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:19:00Z |
Product mix optimization for semiconductor manufacturing based on AHP and ANP analysis
|
Chung, SH; Lee, AHI; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:18:54Z |
Cost benefit analysis of series systems with warm standby components and general repair time
|
Wang, KH; Liu, YC; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:18:52Z |
Monitoring manufacturing quality for multiple Li-BPIC processes based on capability index C-pmk
|
Pearn, WL; Shu, MH; Hsu, BM |
显示项目 56-65 / 91 (共10页)
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