| 國立交通大學 |
2014-12-08T15:41:42Z |
A practical implementation of the incapability index C-pp
|
Pearn, WL; Chen, KL; Chen, KS |
| 國立交通大學 |
2014-12-08T15:41:41Z |
Maximum entropy analysis to the N policy M/G/1 queueing system with a removable server
|
Wang, KH; Chuang, SL; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:41:39Z |
Testing process capability for one-sided specification limit with application to the voltage level translator
|
Lin, PC; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:41:27Z |
Job order releasing and throughput planning for multi-priority orders in wafer fabs
|
Chung, SH; Pearn, WL; Lee, AHI; Ke, WT |
| 國立交通大學 |
2014-12-08T15:41:25Z |
A Bayesian-like estimator of the process capability index C-pmk
|
Pearn, WL; Lin, GH |
| 國立交通大學 |
2014-12-08T15:41:16Z |
Capability measures for processes with multiple characteristics
|
Chen, KS; Pearn, WL; Lin, PC |
| 國立交通大學 |
2014-12-08T15:41:15Z |
Capability measures for m-dependent stationary processes
|
Chen, SM; Hsu, YS; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:41:14Z |
An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators
|
Pearn, WL; Shu, MH |
| 國立交通大學 |
2014-12-08T15:41:08Z |
A reliable procedure for testing linear regulators with one-sided specification limits based on multiple samples
|
Pearn, WL; Lin, GH |
| 國立交通大學 |
2014-12-08T15:40:48Z |
Manufacturing capability control for multiple power-distribution switch processes based on modified C-pk MPPAC
|
Pearn, WL; Shu, MH |
| 國立交通大學 |
2014-12-08T15:40:33Z |
An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators (vol 43, pg 495, 2003)
|
Pearn, WL; Shu, MH |
| 國立交通大學 |
2014-12-08T15:40:32Z |
On the Maximum Benefit Chinese Postman Problem
|
Pearn, WL; Wang, KH |
| 國立交通大學 |
2014-12-08T15:40:12Z |
Lower confidence bounds with sample size information for C-pm applied to production yield assurance
|
Pearn, WL; Shu, MH |
| 國立交通大學 |
2014-12-08T15:40:08Z |
Distributional and inferential properties of the estimated precision C-p based on multiple samples
|
Pearn, WL; Yang, YS |
| 國立交通大學 |
2014-12-08T15:40:07Z |
Cost benefit analysis of series systems with warm standby components
|
Wang, KH; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:39:50Z |
Measuring process yield based on the capability index C-pm
|
Pearn, WL; Lin, PC |
| 國立交通大學 |
2014-12-08T15:39:50Z |
Measuring manufacturing capability based on lower confidence bounds of C-pmk applied to current transmitter process
|
Pearn, WL; Shu, MH |
| 國立交通大學 |
2014-12-08T15:39:46Z |
The C ''(pk) index for asymmetric tolerances: Implications and inference
|
Pearn, WL; Lin, PC; Chen, KS |
| 國立交通大學 |
2014-12-08T15:39:41Z |
Normal approximation to the distribution of the estimated yield index S-pk
|
Pearn, WL; Lin, GH; Wang, KH |
| 國立交通大學 |
2014-12-08T15:39:31Z |
Sensitivity analysis of the optimal management policy for a queuing system with a removable and non-reliable server
|
Pearn, WL; Ke, JC; Chang, YC |
| 國立交通大學 |
2014-12-08T15:39:20Z |
A case study on the multistage IC final testing scheduling problem with reentry
|
Pearn, WL; Chung, SH; Chen, AY; Yang, MH |
| 國立交通大學 |
2014-12-08T15:39:16Z |
C-pm MPPAC for manufacturing quality control applied to precision voltage reference process
|
Pearn, WL; Shu, MH; Hsu, BM |
| 國立交通大學 |
2014-12-08T15:39:09Z |
On the distributional properties of the estimated process accuracy index C-a
|
Lin, GH; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:39:06Z |
Accuracy analysis of the estimated process treld based onS(pk)
|
Pearn, WL; Chuang, CC |
| 國立交通大學 |
2014-12-08T15:39:04Z |
Optimal management of the N-policy M/E-k/1 queuing system with a removable service station: a sensitivity investigation
|
Pearn, WL; Chang, YC |
| 國立交通大學 |
2014-12-08T15:38:57Z |
Lower confidence bounds for C-PU and C-PL based on multiple samples with application to production yield assurance
|
Pearn, WL; Shu, MH; Hsu, BM |
| 國立交通大學 |
2014-12-08T15:38:52Z |
C-pm MPPAC for manufacturing quality control applied to the precision voltage reference process
|
Pearn, WL; Shu, MH; Hsu, BM |
| 國立交通大學 |
2014-12-08T15:38:50Z |
Procedure for supplier selection based on C-pm applied to super twisted nematic liquid crystal display processes
|
Pearn, WL; Wu, CW; Lin, HC |
| 國立交通大學 |
2014-12-08T15:37:25Z |
Distributional and inferential properties of the process loss indices
|
Pearn, WL; Chang, YC; Wu, CW |
| 國立交通大學 |
2014-12-08T15:37:20Z |
Algorithms for the wafer probing scheduling problem with sequence-dependent set-up time and due date restrictions
|
Pearn, WL; Chung, SH; Yang, MH; Chen, YH |
| 國立交通大學 |
2014-12-08T15:37:14Z |
Quality-yield measure for production processes with very low fraction defective
|
Pearn, WL; Chang, YC; Wu, CW |
| 國立交通大學 |
2014-12-08T15:37:13Z |
Testing process performance based on capability index C-pk with critical values
|
Pearn, WL; Lin, PC |
| 國立交通大學 |
2014-12-08T15:36:51Z |
Bootstrap approach for estimating process quality yield with application to light emitting diodes
|
Pearn, WL; Chang, YC; Wu, CW |
| 國立交通大學 |
2014-12-08T15:36:51Z |
Procedures for testing manufacturing precision C(p)based on ((X)over-bar, R) or ((X)over-bar, S) control chart samples
|
Pearn, WL; Wu, CW; Chuang, HC |
| 國立交通大學 |
2014-12-08T15:36:50Z |
Capability measure for asymmetric tolerance non-normal processes applied to speaker driver manufacturing
|
Pearn, WL; Wu, CW; Wang, KH |
| 國立交通大學 |
2014-12-08T15:36:50Z |
Measuring manufacturing capability for couplers and wavelength division multiplexers
|
Wu, CW; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:36:10Z |
Process capabitity assessment for index C-pk based on bayesian approach
|
Pearn, WL; Wu, CW |
| 國立交通大學 |
2014-12-08T15:34:57Z |
Capability testing based on CPM with multiple samples
|
Wu, CW; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:34:50Z |
A linear programming model for the control wafers downgrading problem
|
Chung, SH; Pearn, WL; Kang, HY |
| 國立交通大學 |
2014-12-08T15:19:28Z |
Control wafers inventory management in the wafer fabrication photolithography area
|
Chung, SH; Pearn, WL; Kang, HY |
| 國立交通大學 |
2014-12-08T15:19:20Z |
Analytic network process (ANP) approach for product mix planning in semiconductor fabricator
|
Chung, SH; Lee, AHI; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:19:05Z |
Assessing process performance based on the incapability index C-pp
|
Lin, PC; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:19:00Z |
Product mix optimization for semiconductor manufacturing based on AHP and ANP analysis
|
Chung, SH; Lee, AHI; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:18:54Z |
Cost benefit analysis of series systems with warm standby components and general repair time
|
Wang, KH; Liu, YC; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:18:52Z |
Monitoring manufacturing quality for multiple Li-BPIC processes based on capability index C-pmk
|
Pearn, WL; Shu, MH; Hsu, BM |
| 國立交通大學 |
2014-12-08T15:18:52Z |
Maximum entropy analysis to the N policy M/G/1 queueing system with server breakdowns and general startup times
|
Wang, KH; Wang, TY; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:18:33Z |
The integrated circuit packaging scheduling problem (ICPSP): A case study
|
Pearn, WL; Chung, SH; Yang, MH; Chen, CY |
| 國立交通大學 |
2014-12-08T15:18:31Z |
A service level model for the control wafers safety inventory problem
|
Chung, SH; Kang, HY; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:18:23Z |
A Bayesian approach for assessing process precision based on multiple samples
|
Pearn, WL; Wu, CW |
| 國立交通大學 |
2014-12-08T15:18:20Z |
A Bayesian approach to obtain a lower bound for the C-pm capability index
|
Lin, GH; Pearn, WL; Yang, YS |
