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Showing items 1-50 of 91 (2 Page(s) Totally)
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| 國立交通大學 |
2019-04-02T06:00:17Z |
Testing process performance based on capability index C-pk with critical values
|
Pearn, WL; Lin, PC |
| 國立交通大學 |
2019-04-02T05:58:59Z |
New generalization of process capability index C-pk
|
Pearn, WL; Chen, KS |
| 國立交通大學 |
2014-12-12T01:31:52Z |
具有第二次可選擇服務、服務者選擇休假之多個服務者排隊分析
|
巫佳煌; Wu, Chia Huang; 彭文理; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:47:25Z |
Improved solutions for the traveling purchaser problem
|
Pearn, WL; Chien, RC |
| 國立交通大學 |
2014-12-08T15:47:16Z |
New generalization of process capability index C-pk
|
Pearn, WL; Chen, KS |
| 國立交通大學 |
2014-12-08T15:46:26Z |
Making decisions in assessing process capability index C-pk
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Pearn, WL; Chen, KS |
| 國立交通大學 |
2014-12-08T15:46:25Z |
Improved solutions for the Chinese postman problem on mixed networks
|
Pearn, WL; Chou, JB |
| 國立交通大學 |
2014-12-08T15:45:51Z |
Estimating capability index C-pk for processes with asymmetric tolerances
|
Pearn, WL; Lin, GH |
| 國立交通大學 |
2014-12-08T15:44:18Z |
Estimating process capability index C"(pmk) for asymmetric tolerances: Distributional properties
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Pearn, WL; Lin, PC; Chen, KS |
| 國立交通大學 |
2014-12-08T15:43:40Z |
On the reliability of the estimated incapability index
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Pearn, WL; Lin, GH |
| 國立交通大學 |
2014-12-08T15:43:28Z |
Capability indices for processes with asymmetric tolerances
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Chen, KS; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:43:00Z |
A case study on the wafer probing scheduling problem
|
Pearn, WL; Chung, SH; Yang, MH |
| 國立交通大學 |
2014-12-08T15:42:49Z |
Minimizing the total machine workload for the wafer probing scheduling problem
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Pearn, WL; Chung, SH; Yang, MH |
| 國立交通大學 |
2014-12-08T15:42:45Z |
On the distribution of the estimated process yield index S-pk
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Lee, JC; Hung, HN; Pearn, WL; Kueng, TL |
| 國立交通大學 |
2014-12-08T15:42:45Z |
Estimated incapability index: Reliability and decision making with sample information
|
Pearn, WL; Lin, GH |
| 國立交通大學 |
2014-12-08T15:42:16Z |
Computer program for calculating the p-value in testing process capability index C-pmk
|
Pearn, WL; Lin, PC |
| 國立交通大學 |
2014-12-08T15:42:13Z |
A multiprocess performance analysis chart based on the incapability index C-pp: an application to the chip resistors
|
Pearn, WL; Ko, CH; Wang, KH |
| 國立交通大學 |
2014-12-08T15:42:07Z |
Testing process performance based on the yield: an application to the liquid-crystal display module
|
Chen, JP; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:42:05Z |
The wafer probing scheduling problem (WPSP)
|
Pearn, WL; Chung, SH; Yang, MH |
| 國立交通大學 |
2014-12-08T15:41:44Z |
A note on the interval estimation of C-pk with asymmetric tolerances
|
Lin, GH; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:41:42Z |
A practical implementation of the incapability index C-pp
|
Pearn, WL; Chen, KL; Chen, KS |
| 國立交通大學 |
2014-12-08T15:41:41Z |
Maximum entropy analysis to the N policy M/G/1 queueing system with a removable server
|
Wang, KH; Chuang, SL; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:41:39Z |
Testing process capability for one-sided specification limit with application to the voltage level translator
|
Lin, PC; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:41:27Z |
Job order releasing and throughput planning for multi-priority orders in wafer fabs
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Chung, SH; Pearn, WL; Lee, AHI; Ke, WT |
| 國立交通大學 |
2014-12-08T15:41:25Z |
A Bayesian-like estimator of the process capability index C-pmk
|
Pearn, WL; Lin, GH |
| 國立交通大學 |
2014-12-08T15:41:16Z |
Capability measures for processes with multiple characteristics
|
Chen, KS; Pearn, WL; Lin, PC |
| 國立交通大學 |
2014-12-08T15:41:15Z |
Capability measures for m-dependent stationary processes
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Chen, SM; Hsu, YS; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:41:14Z |
An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators
|
Pearn, WL; Shu, MH |
| 國立交通大學 |
2014-12-08T15:41:08Z |
A reliable procedure for testing linear regulators with one-sided specification limits based on multiple samples
|
Pearn, WL; Lin, GH |
| 國立交通大學 |
2014-12-08T15:40:48Z |
Manufacturing capability control for multiple power-distribution switch processes based on modified C-pk MPPAC
|
Pearn, WL; Shu, MH |
| 國立交通大學 |
2014-12-08T15:40:33Z |
An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators (vol 43, pg 495, 2003)
|
Pearn, WL; Shu, MH |
| 國立交通大學 |
2014-12-08T15:40:32Z |
On the Maximum Benefit Chinese Postman Problem
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Pearn, WL; Wang, KH |
| 國立交通大學 |
2014-12-08T15:40:12Z |
Lower confidence bounds with sample size information for C-pm applied to production yield assurance
|
Pearn, WL; Shu, MH |
| 國立交通大學 |
2014-12-08T15:40:08Z |
Distributional and inferential properties of the estimated precision C-p based on multiple samples
|
Pearn, WL; Yang, YS |
| 國立交通大學 |
2014-12-08T15:40:07Z |
Cost benefit analysis of series systems with warm standby components
|
Wang, KH; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:39:50Z |
Measuring process yield based on the capability index C-pm
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Pearn, WL; Lin, PC |
| 國立交通大學 |
2014-12-08T15:39:50Z |
Measuring manufacturing capability based on lower confidence bounds of C-pmk applied to current transmitter process
|
Pearn, WL; Shu, MH |
| 國立交通大學 |
2014-12-08T15:39:46Z |
The C ''(pk) index for asymmetric tolerances: Implications and inference
|
Pearn, WL; Lin, PC; Chen, KS |
| 國立交通大學 |
2014-12-08T15:39:41Z |
Normal approximation to the distribution of the estimated yield index S-pk
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Pearn, WL; Lin, GH; Wang, KH |
| 國立交通大學 |
2014-12-08T15:39:31Z |
Sensitivity analysis of the optimal management policy for a queuing system with a removable and non-reliable server
|
Pearn, WL; Ke, JC; Chang, YC |
| 國立交通大學 |
2014-12-08T15:39:20Z |
A case study on the multistage IC final testing scheduling problem with reentry
|
Pearn, WL; Chung, SH; Chen, AY; Yang, MH |
| 國立交通大學 |
2014-12-08T15:39:16Z |
C-pm MPPAC for manufacturing quality control applied to precision voltage reference process
|
Pearn, WL; Shu, MH; Hsu, BM |
| 國立交通大學 |
2014-12-08T15:39:09Z |
On the distributional properties of the estimated process accuracy index C-a
|
Lin, GH; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:39:06Z |
Accuracy analysis of the estimated process treld based onS(pk)
|
Pearn, WL; Chuang, CC |
| 國立交通大學 |
2014-12-08T15:39:04Z |
Optimal management of the N-policy M/E-k/1 queuing system with a removable service station: a sensitivity investigation
|
Pearn, WL; Chang, YC |
| 國立交通大學 |
2014-12-08T15:38:57Z |
Lower confidence bounds for C-PU and C-PL based on multiple samples with application to production yield assurance
|
Pearn, WL; Shu, MH; Hsu, BM |
| 國立交通大學 |
2014-12-08T15:38:52Z |
C-pm MPPAC for manufacturing quality control applied to the precision voltage reference process
|
Pearn, WL; Shu, MH; Hsu, BM |
| 國立交通大學 |
2014-12-08T15:38:50Z |
Procedure for supplier selection based on C-pm applied to super twisted nematic liquid crystal display processes
|
Pearn, WL; Wu, CW; Lin, HC |
| 國立交通大學 |
2014-12-08T15:37:25Z |
Distributional and inferential properties of the process loss indices
|
Pearn, WL; Chang, YC; Wu, CW |
| 國立交通大學 |
2014-12-08T15:37:20Z |
Algorithms for the wafer probing scheduling problem with sequence-dependent set-up time and due date restrictions
|
Pearn, WL; Chung, SH; Yang, MH; Chen, YH |
Showing items 1-50 of 91 (2 Page(s) Totally)
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