|
English
|
正體中文
|
简体中文
|
0
|
|
???header.visitor??? :
51806294
???header.onlineuser??? :
1153
???header.sponsordeclaration???
|
|
|
|
???tair.name??? >
???browser.page.title.author???
|
"pearn wl"???jsp.browse.items-by-author.description???
Showing items 11-20 of 91 (10 Page(s) Totally)
<< < 1 2 3 4 5 6 7 8 9 10 > >>
View [10|25|50] records per page
| 國立交通大學 |
2014-12-08T15:43:28Z |
Capability indices for processes with asymmetric tolerances
|
Chen, KS; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:43:00Z |
A case study on the wafer probing scheduling problem
|
Pearn, WL; Chung, SH; Yang, MH |
| 國立交通大學 |
2014-12-08T15:42:49Z |
Minimizing the total machine workload for the wafer probing scheduling problem
|
Pearn, WL; Chung, SH; Yang, MH |
| 國立交通大學 |
2014-12-08T15:42:45Z |
On the distribution of the estimated process yield index S-pk
|
Lee, JC; Hung, HN; Pearn, WL; Kueng, TL |
| 國立交通大學 |
2014-12-08T15:42:45Z |
Estimated incapability index: Reliability and decision making with sample information
|
Pearn, WL; Lin, GH |
| 國立交通大學 |
2014-12-08T15:42:16Z |
Computer program for calculating the p-value in testing process capability index C-pmk
|
Pearn, WL; Lin, PC |
| 國立交通大學 |
2014-12-08T15:42:13Z |
A multiprocess performance analysis chart based on the incapability index C-pp: an application to the chip resistors
|
Pearn, WL; Ko, CH; Wang, KH |
| 國立交通大學 |
2014-12-08T15:42:07Z |
Testing process performance based on the yield: an application to the liquid-crystal display module
|
Chen, JP; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:42:05Z |
The wafer probing scheduling problem (WPSP)
|
Pearn, WL; Chung, SH; Yang, MH |
| 國立交通大學 |
2014-12-08T15:41:44Z |
A note on the interval estimation of C-pk with asymmetric tolerances
|
Lin, GH; Pearn, WL |
Showing items 11-20 of 91 (10 Page(s) Totally)
<< < 1 2 3 4 5 6 7 8 9 10 > >>
View [10|25|50] records per page
|
