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Showing items 26-50 of 91 (4 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:41:16Z |
Capability measures for processes with multiple characteristics
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Chen, KS; Pearn, WL; Lin, PC |
| 國立交通大學 |
2014-12-08T15:41:15Z |
Capability measures for m-dependent stationary processes
|
Chen, SM; Hsu, YS; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:41:14Z |
An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators
|
Pearn, WL; Shu, MH |
| 國立交通大學 |
2014-12-08T15:41:08Z |
A reliable procedure for testing linear regulators with one-sided specification limits based on multiple samples
|
Pearn, WL; Lin, GH |
| 國立交通大學 |
2014-12-08T15:40:48Z |
Manufacturing capability control for multiple power-distribution switch processes based on modified C-pk MPPAC
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Pearn, WL; Shu, MH |
| 國立交通大學 |
2014-12-08T15:40:33Z |
An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators (vol 43, pg 495, 2003)
|
Pearn, WL; Shu, MH |
| 國立交通大學 |
2014-12-08T15:40:32Z |
On the Maximum Benefit Chinese Postman Problem
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Pearn, WL; Wang, KH |
| 國立交通大學 |
2014-12-08T15:40:12Z |
Lower confidence bounds with sample size information for C-pm applied to production yield assurance
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Pearn, WL; Shu, MH |
| 國立交通大學 |
2014-12-08T15:40:08Z |
Distributional and inferential properties of the estimated precision C-p based on multiple samples
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Pearn, WL; Yang, YS |
| 國立交通大學 |
2014-12-08T15:40:07Z |
Cost benefit analysis of series systems with warm standby components
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Wang, KH; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:39:50Z |
Measuring process yield based on the capability index C-pm
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Pearn, WL; Lin, PC |
| 國立交通大學 |
2014-12-08T15:39:50Z |
Measuring manufacturing capability based on lower confidence bounds of C-pmk applied to current transmitter process
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Pearn, WL; Shu, MH |
| 國立交通大學 |
2014-12-08T15:39:46Z |
The C ''(pk) index for asymmetric tolerances: Implications and inference
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Pearn, WL; Lin, PC; Chen, KS |
| 國立交通大學 |
2014-12-08T15:39:41Z |
Normal approximation to the distribution of the estimated yield index S-pk
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Pearn, WL; Lin, GH; Wang, KH |
| 國立交通大學 |
2014-12-08T15:39:31Z |
Sensitivity analysis of the optimal management policy for a queuing system with a removable and non-reliable server
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Pearn, WL; Ke, JC; Chang, YC |
| 國立交通大學 |
2014-12-08T15:39:20Z |
A case study on the multistage IC final testing scheduling problem with reentry
|
Pearn, WL; Chung, SH; Chen, AY; Yang, MH |
| 國立交通大學 |
2014-12-08T15:39:16Z |
C-pm MPPAC for manufacturing quality control applied to precision voltage reference process
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Pearn, WL; Shu, MH; Hsu, BM |
| 國立交通大學 |
2014-12-08T15:39:09Z |
On the distributional properties of the estimated process accuracy index C-a
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Lin, GH; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:39:06Z |
Accuracy analysis of the estimated process treld based onS(pk)
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Pearn, WL; Chuang, CC |
| 國立交通大學 |
2014-12-08T15:39:04Z |
Optimal management of the N-policy M/E-k/1 queuing system with a removable service station: a sensitivity investigation
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Pearn, WL; Chang, YC |
| 國立交通大學 |
2014-12-08T15:38:57Z |
Lower confidence bounds for C-PU and C-PL based on multiple samples with application to production yield assurance
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Pearn, WL; Shu, MH; Hsu, BM |
| 國立交通大學 |
2014-12-08T15:38:52Z |
C-pm MPPAC for manufacturing quality control applied to the precision voltage reference process
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Pearn, WL; Shu, MH; Hsu, BM |
| 國立交通大學 |
2014-12-08T15:38:50Z |
Procedure for supplier selection based on C-pm applied to super twisted nematic liquid crystal display processes
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Pearn, WL; Wu, CW; Lin, HC |
| 國立交通大學 |
2014-12-08T15:37:25Z |
Distributional and inferential properties of the process loss indices
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Pearn, WL; Chang, YC; Wu, CW |
| 國立交通大學 |
2014-12-08T15:37:20Z |
Algorithms for the wafer probing scheduling problem with sequence-dependent set-up time and due date restrictions
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Pearn, WL; Chung, SH; Yang, MH; Chen, YH |
Showing items 26-50 of 91 (4 Page(s) Totally)
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