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Showing items 51-75 of 91 (4 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:37:14Z |
Quality-yield measure for production processes with very low fraction defective
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Pearn, WL; Chang, YC; Wu, CW |
| 國立交通大學 |
2014-12-08T15:37:13Z |
Testing process performance based on capability index C-pk with critical values
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Pearn, WL; Lin, PC |
| 國立交通大學 |
2014-12-08T15:36:51Z |
Bootstrap approach for estimating process quality yield with application to light emitting diodes
|
Pearn, WL; Chang, YC; Wu, CW |
| 國立交通大學 |
2014-12-08T15:36:51Z |
Procedures for testing manufacturing precision C(p)based on ((X)over-bar, R) or ((X)over-bar, S) control chart samples
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Pearn, WL; Wu, CW; Chuang, HC |
| 國立交通大學 |
2014-12-08T15:36:50Z |
Capability measure for asymmetric tolerance non-normal processes applied to speaker driver manufacturing
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Pearn, WL; Wu, CW; Wang, KH |
| 國立交通大學 |
2014-12-08T15:36:50Z |
Measuring manufacturing capability for couplers and wavelength division multiplexers
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Wu, CW; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:36:10Z |
Process capabitity assessment for index C-pk based on bayesian approach
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Pearn, WL; Wu, CW |
| 國立交通大學 |
2014-12-08T15:34:57Z |
Capability testing based on CPM with multiple samples
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Wu, CW; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:34:50Z |
A linear programming model for the control wafers downgrading problem
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Chung, SH; Pearn, WL; Kang, HY |
| 國立交通大學 |
2014-12-08T15:19:28Z |
Control wafers inventory management in the wafer fabrication photolithography area
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Chung, SH; Pearn, WL; Kang, HY |
| 國立交通大學 |
2014-12-08T15:19:20Z |
Analytic network process (ANP) approach for product mix planning in semiconductor fabricator
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Chung, SH; Lee, AHI; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:19:05Z |
Assessing process performance based on the incapability index C-pp
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Lin, PC; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:19:00Z |
Product mix optimization for semiconductor manufacturing based on AHP and ANP analysis
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Chung, SH; Lee, AHI; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:18:54Z |
Cost benefit analysis of series systems with warm standby components and general repair time
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Wang, KH; Liu, YC; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:18:52Z |
Monitoring manufacturing quality for multiple Li-BPIC processes based on capability index C-pmk
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Pearn, WL; Shu, MH; Hsu, BM |
| 國立交通大學 |
2014-12-08T15:18:52Z |
Maximum entropy analysis to the N policy M/G/1 queueing system with server breakdowns and general startup times
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Wang, KH; Wang, TY; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:18:33Z |
The integrated circuit packaging scheduling problem (ICPSP): A case study
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Pearn, WL; Chung, SH; Yang, MH; Chen, CY |
| 國立交通大學 |
2014-12-08T15:18:31Z |
A service level model for the control wafers safety inventory problem
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Chung, SH; Kang, HY; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:18:23Z |
A Bayesian approach for assessing process precision based on multiple samples
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Pearn, WL; Wu, CW |
| 國立交通大學 |
2014-12-08T15:18:20Z |
A Bayesian approach to obtain a lower bound for the C-pm capability index
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Lin, GH; Pearn, WL; Yang, YS |
| 國立交通大學 |
2014-12-08T15:18:12Z |
Approximate solutions for the Maximum Benefit Chinese Postman Problem
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Pearn, WL; Chiu, WC |
| 國立交通大學 |
2014-12-08T15:18:02Z |
Testing manufacturing performance based on capability index C-pm
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Lin, PC; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:17:59Z |
Testing process capability based on C-pm in the presence of random measurement errors
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Pearn, WL; Shu, MH; Hsu, BM |
| 國立交通大學 |
2014-12-08T15:17:40Z |
Critical acceptance values and sample sizes of a variables sampling plan for very low fraction of detectives
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Pearn, WL; Wu, CW |
| 國立交通大學 |
2014-12-08T15:16:52Z |
Variables sampling plans with PPM fraction of defectives and process loss consideration
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Pearn, WL; Wu, CW |
Showing items 51-75 of 91 (4 Page(s) Totally)
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