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Showing items 61-70 of 91 (10 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:19:20Z |
Analytic network process (ANP) approach for product mix planning in semiconductor fabricator
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Chung, SH; Lee, AHI; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:19:05Z |
Assessing process performance based on the incapability index C-pp
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Lin, PC; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:19:00Z |
Product mix optimization for semiconductor manufacturing based on AHP and ANP analysis
|
Chung, SH; Lee, AHI; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:18:54Z |
Cost benefit analysis of series systems with warm standby components and general repair time
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Wang, KH; Liu, YC; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:18:52Z |
Monitoring manufacturing quality for multiple Li-BPIC processes based on capability index C-pmk
|
Pearn, WL; Shu, MH; Hsu, BM |
| 國立交通大學 |
2014-12-08T15:18:52Z |
Maximum entropy analysis to the N policy M/G/1 queueing system with server breakdowns and general startup times
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Wang, KH; Wang, TY; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:18:33Z |
The integrated circuit packaging scheduling problem (ICPSP): A case study
|
Pearn, WL; Chung, SH; Yang, MH; Chen, CY |
| 國立交通大學 |
2014-12-08T15:18:31Z |
A service level model for the control wafers safety inventory problem
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Chung, SH; Kang, HY; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:18:23Z |
A Bayesian approach for assessing process precision based on multiple samples
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Pearn, WL; Wu, CW |
| 國立交通大學 |
2014-12-08T15:18:20Z |
A Bayesian approach to obtain a lower bound for the C-pm capability index
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Lin, GH; Pearn, WL; Yang, YS |
Showing items 61-70 of 91 (10 Page(s) Totally)
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