|
English
|
正體中文
|
简体中文
|
0
|
|
???header.visitor??? :
51802622
???header.onlineuser??? :
1069
???header.sponsordeclaration???
|
|
|
|
???tair.name??? >
???browser.page.title.author???
|
"pearn wl"???jsp.browse.items-by-author.description???
Showing items 66-75 of 91 (10 Page(s) Totally)
<< < 1 2 3 4 5 6 7 8 9 10 > >>
View [10|25|50] records per page
| 國立交通大學 |
2014-12-08T15:18:52Z |
Maximum entropy analysis to the N policy M/G/1 queueing system with server breakdowns and general startup times
|
Wang, KH; Wang, TY; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:18:33Z |
The integrated circuit packaging scheduling problem (ICPSP): A case study
|
Pearn, WL; Chung, SH; Yang, MH; Chen, CY |
| 國立交通大學 |
2014-12-08T15:18:31Z |
A service level model for the control wafers safety inventory problem
|
Chung, SH; Kang, HY; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:18:23Z |
A Bayesian approach for assessing process precision based on multiple samples
|
Pearn, WL; Wu, CW |
| 國立交通大學 |
2014-12-08T15:18:20Z |
A Bayesian approach to obtain a lower bound for the C-pm capability index
|
Lin, GH; Pearn, WL; Yang, YS |
| 國立交通大學 |
2014-12-08T15:18:12Z |
Approximate solutions for the Maximum Benefit Chinese Postman Problem
|
Pearn, WL; Chiu, WC |
| 國立交通大學 |
2014-12-08T15:18:02Z |
Testing manufacturing performance based on capability index C-pm
|
Lin, PC; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:17:59Z |
Testing process capability based on C-pm in the presence of random measurement errors
|
Pearn, WL; Shu, MH; Hsu, BM |
| 國立交通大學 |
2014-12-08T15:17:40Z |
Critical acceptance values and sample sizes of a variables sampling plan for very low fraction of detectives
|
Pearn, WL; Wu, CW |
| 國立交通大學 |
2014-12-08T15:16:52Z |
Variables sampling plans with PPM fraction of defectives and process loss consideration
|
Pearn, WL; Wu, CW |
Showing items 66-75 of 91 (10 Page(s) Totally)
<< < 1 2 3 4 5 6 7 8 9 10 > >>
View [10|25|50] records per page
|
