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Showing items 1-3 of 3 (1 Page(s) Totally) 1 View [10|25|50] records per page
國立交通大學 |
2019-04-03T06:44:34Z |
An Improved EEHEMT RF Noise Model for 0.25 mu m InGaP pHEMT Transistor Using Verilog-A Language
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Peng, An-Sam; Wu, Lin-Kun |
國立交通大學 |
2014-12-08T15:33:44Z |
Through-Silicon-Via Characterization and Modeling Using a Novel One-Port De-Embedding Technique
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Peng, An-Sam; Cho, Ming-Hsiang; Wang, Yueh-Hua; Wang, Meng-Fang; Chen, David; Wu, Lin-Kun |
國立交通大學 |
2014-12-08T15:12:44Z |
Miniature RF test structure for on-wafer device testing and in-line process monitoring
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Cho, Ming-Hsiang; Lee, Ryan; Peng, An-Sam; Chen, David; Yeh, Chune-Sin; Wu, Lin-Kun |
Showing items 1-3 of 3 (1 Page(s) Totally) 1 View [10|25|50] records per page
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