|
English
|
正體中文
|
简体中文
|
總筆數 :2853522
|
|
造訪人次 :
45200945
線上人數 :
652
教育部委託研究計畫 計畫執行:國立臺灣大學圖書館
|
|
|
"pinaton j"的相關文件
顯示項目 1-8 / 8 (共1頁)
1
每頁顯示[10|25|50]項目
| 臺大學術典藏 |
2020-03-02T06:40:10Z |
Efficient FDC based on hierarchical tool condition monitoring scheme
|
Blue, J.; Roussy, A.; Thieullen, A.; Pinaton, J.; JAKEY BLUE |
| 臺大學術典藏 |
2020-03-02T06:40:09Z |
Run-To-Run sensor variation monitoring for process fault diagnosis in semiconductor manufacturing
|
Blue, J.; Roussy, A.; Pinaton, J.; JAKEY BLUE |
| 臺大學術典藏 |
2020-03-02T06:40:09Z |
FDC R2R variation monitoring for sensor level diagnosis in tool condition hierarchy
|
Blue, J.; Roussy, A.; Pinaton, J.; JAKEY BLUE |
| 臺大學術典藏 |
2020-03-02T06:40:08Z |
The light behavior from shallow trench isolation profiles at chemical mechanical planarization step and correlation with optical endpoint system by interferometry
|
Bourzgui, S.; Georges, G.; Roussy, A.; Blue, J.; Faivre, E.; Pinaton, J.; JAKEY BLUE |
| 臺大學術典藏 |
2020-03-02T06:40:08Z |
Key Effects and Process Parameters Extraction on the CD of Reactive Ion Etching (RIE) Based on DOE Modeling
|
Rizquez, M.; Roussy, A.; Blue, J.; Bucelle, L.; Pinaton, J.; Pasquet, J.; JAKEY BLUE |
| 臺大學術典藏 |
2020-03-02T06:40:08Z |
Translation-Invariant Multiscale Energy-Based PCA for Monitoring Batch Processes in Semiconductor Manufacturing
|
Rato, T.J.; Blue, J.; Pinaton, J.; Reis, M.S.; JAKEY BLUE |
| 臺大學術典藏 |
2020-03-02T06:40:07Z |
Advanced run-to-run controller in semiconductor manufacturing with real-time equipment condition: APC: Advanced process control; AM: Advanced metrology
|
Yang, W.-T.; Blue, J.; Roussy, A.; Reis, M.; Pinaton, J.; JAKEY BLUE |
| 臺大學術典藏 |
2020-03-02T06:40:06Z |
Virtual metrology modeling based on Gaussian Bayesian network
|
Yang, W.-T.; Blue, J.; Roussy, A.; Reis, M.S.; Pinaton, J.; JAKEY BLUE |
顯示項目 1-8 / 8 (共1頁)
1
每頁顯示[10|25|50]項目
|
