| 義守大學 |
2015-04 |
Linear Time Approximation Algorithms for the Relay Node Placement Problem in Wireless Sensor Networks with Hexagon Tessellation
|
Chi-Chang Chen;Chi-Yu Chang;Po-Ying Chen |
| 義守大學 |
2014-11 |
Using Capacitance Sensor to Extract Characteristic Signals of Dozing from Skin Surface
|
Po-Ying Chen;Chi-Chang Chen;Wen-Kuan Yeh;Yukan Chang;Der-Chen Huang;Shyr-Shen Yu;Chwei-Shyong Tsai;Yu-Jung Huang;Wei-Cheng Lin;Shao-I Chu;Chung-Long Pan;Tsung-Hung Lin;Shyh-Chang Liu |
| 義守大學 |
2013-08 |
Relative Location Estimation over Wireless Sensor Networks with Principal Component Analysis Technique
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Shao-I Chu;Chih-Yuan Lien;Wei-Cheng Lin;Yu-Jung Huang;Chung-Long Pan;Po-Ying Chen |
| 義守大學 |
2013-02 |
The impact of interface/border defect on performance and reliability of high-k/metal-gate CMOSFET
|
Wen-Kuan Yeh;Po-Ying Chen;Kwang-Jow Gan;Jer-Chyi Wang;Chao Sung Lai |
| 義守大學 |
2012-11 |
Lightweight authentication scheme for wireless sensor networks
|
Chih-Hung Huang;HsuanHsun Wu;Yu-Jung Huang;Wei-Cheng Lin;Chung-Long Pan;Shao-I Chu;Po-Ying Chen |
| 義守大學 |
2011-03 |
The Improvement of High-k/Metal Gate pMOSFET Performance and Reliability using Optimized Si cap/SiGe Channel Structure
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Wen-Kuan Yeh;Yu-Ting Chen;Fon-Shan Huang;Chia-Wei Hsu;Chun-Yu Chen;Yean-Kuen Fang;Kwang-Jow Gan;Po-Ying Chen |
| 義守大學 |
2010-11 |
Relationship between wafer edge design and its ultimate mechanical strength
|
Po-Ying Chen ;Ming-Hsing Tsai;Wen-Kuan Yeh;Ming-Haw Jing;Yukon Chang |
| 義守大學 |
2010-11 |
Characteristics between Electrical Properties and Controlling of Oxygen Precipitations during ULSI Process
|
Po-Ying Chen;Shih-Chun Hung;Wen-Kuan Yeh;Ming Hsiung Tsai;Wei-Chou Chen;Kang-Ping Li;Pei-Chen Yeh;Hsin-Ying Huang |
| 義守大學 |
2010-10 |
Relationship between wafer fracture reduction and controlling during the edge manufacturing process
|
Po-Ying Chen;Ming-Hsing Tsai;Wen-Kuan Yeh;Ming-Haw Jing;Yukon Chang |
| 義守大學 |
2010-02 |
Relationship between wafer fracture reduction and controlling during the edge manufacturing process
|
Po-Ying Chen; Ming-Hsing Tsai; Wen-Kuan Yeh; Ming-Haw Jing; Yukon Chang |
| 義守大學 |
2009/12/09 |
An improvement method for the reliability of copper metallization process
|
Po-Ying Chen ; Po-Han Wu ; Woei Jye Ong |
| 義守大學 |
2009-12 |
Investigation of the Relationship between Whole -Wafer Strength and Control of its Edge Engineering
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Po-Ying Chen;Ming-Hsing Tsai;Wen-Kuan Yeh;Ming-Haw Jing;Yukon Chang |
| 義守大學 |
2009-08 |
Development of a brand new system using RFID combining with wireless sensor network (WSNs) for real-time doze alarm
|
Po-Ying Chen;Po-Han Wu;Woei Jye Ong;Yu-Jung Huang;Wei-cheng Lin;Tsung-Long Pan |
| 義守大學 |
2009-08 |
Development of a brand new system using RFID combining with wireless sensor network (WSNs) for real-time doze alarm
|
Po-Ying Chen;Po-Han Wu;Woei Jye Ong;Yu-Jung Huang;Wei-cheng Lin;TSung-long Pan |
| 義守大學 |
2009-03 |
The Impact of Strain Technology on FUSI Gate SOI CMOSFET
|
Wen-Kuan Yeh;Jean-An Wang;Ming-Hsing Tsai;Chien-Ting Lin;Po-Ying Chen |
| 義守大學 |
2008/08/20 |
Dynamic scanning method to clarify the mechanism of WLCSP package reliability issue
|
Po-Ying Chen ; Chwei-Shyong Tsai ; Ming-Hsiung Tsai ; Heng-Yu Kung ; Shen-Li Chen ; Jing, M.H. ; Wen-Kuan Yeh |
| 義守大學 |
2008/04/27 |
Effect of crystal-originated particles (COPs) on ULSI process integrity
|
Po-Ying Chen ; Chen, S.L. ; Tsai, M.H. ; Jing, M.H. ; Lin, T.-C. ; Wen-Kuan Yeh |
| 義守大學 |
2008-12 |
Degradation of Gate Oxide Integrity by Formation of Tiny Holes by Metal Contamination of Raw Wafer
|
Po-Ying Chen |
| 義守大學 |
2008-10 |
Elucidating the effects of current stress history on reliability characteristics by dynamic analysis
|
Po-Ying Chen;Shen-Li Chen;Ming-Hsiung Tsai;Wen-Kuan Yeh;Heng-Yu Kung;YuKon Chang |
| 義守大學 |
2008-02 |
Reliability and characteristics of wafer-level chip-scale packages under current stress
|
Po-Ying Chen;Heng-Yu Kung;Yi-Shao Lai;Ming Hsiung Tsai;Wen-Kuan Yeh |
| 義守大學 |
2008 |
Characteristics of spontaneous reaction occurred by metal contamination and silicon substrate for ultralarge-scale integration semiconductor process
|
Po-Ying Chen |
| 義守大學 |
2007/12/20 |
Investigation of Electrostatic Charges Trapping during 12-Inch Deep Submicron VLSI Proces
|
Po-Ying Chen ; Chen, S.L. ; Tsai, M.H. ; Jing, M.H. ; Lin, T.-C. |
| 義守大學 |
2007/12/20 |
Implement of an Improvement Particle Monitoring Methodology in an Industry Production Process
|
Po-Ying Chen ; Chen, S.L. ; Tsai, M.H. ; Jing, M.H. ; Lin, T.-C. |
| 義守大學 |
2007/12/20 |
Investigation of Wafer Strength in 12 inch Bare Wafer for Prevent Wafer Breakage
|
Po-Ying Chen ; Jing, M.H. ; Tin, T.C. |
| 義守大學 |
2007/07/11 |
The Defects of Silicon Reacted with Carbon Content Vapour in ULSI Nano-meter-Generation Technology
|
Po-Ying Chen ; Shen-Li Chen ; Ming-Hsiung Tsai ; Jing, M.H. ; Lin, T.-C. ; Cheng-Chia Kuo |
