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机构 日期 题名 作者
義守大學 2015-04 Linear Time Approximation Algorithms for the Relay Node Placement Problem in Wireless Sensor Networks with Hexagon Tessellation Chi-Chang Chen;Chi-Yu Chang;Po-Ying Chen
義守大學 2014-11 Using Capacitance Sensor to Extract Characteristic Signals of Dozing from Skin Surface Po-Ying Chen;Chi-Chang Chen;Wen-Kuan Yeh;Yukan Chang;Der-Chen Huang;Shyr-Shen Yu;Chwei-Shyong Tsai;Yu-Jung Huang;Wei-Cheng Lin;Shao-I Chu;Chung-Long Pan;Tsung-Hung Lin;Shyh-Chang Liu
義守大學 2013-08 Relative Location Estimation over Wireless Sensor Networks with Principal Component Analysis Technique Shao-I Chu;Chih-Yuan Lien;Wei-Cheng Lin;Yu-Jung Huang;Chung-Long Pan;Po-Ying Chen
義守大學 2013-02 The impact of interface/border defect on performance and reliability of high-k/metal-gate CMOSFET Wen-Kuan Yeh;Po-Ying Chen;Kwang-Jow Gan;Jer-Chyi Wang;Chao Sung Lai
義守大學 2012-11 Lightweight authentication scheme for wireless sensor networks Chih-Hung Huang;HsuanHsun Wu;Yu-Jung Huang;Wei-Cheng Lin;Chung-Long Pan;Shao-I Chu;Po-Ying Chen
義守大學 2011-03 The Improvement of High-k/Metal Gate pMOSFET Performance and Reliability using Optimized Si cap/SiGe Channel Structure Wen-Kuan Yeh;Yu-Ting Chen;Fon-Shan Huang;Chia-Wei Hsu;Chun-Yu Chen;Yean-Kuen Fang;Kwang-Jow Gan;Po-Ying Chen
義守大學 2010-11 Relationship between wafer edge design and its ultimate mechanical strength Po-Ying Chen ;Ming-Hsing Tsai;Wen-Kuan Yeh;Ming-Haw Jing;Yukon Chang
義守大學 2010-11 Characteristics between Electrical Properties and Controlling of Oxygen Precipitations during ULSI Process Po-Ying Chen;Shih-Chun Hung;Wen-Kuan Yeh;Ming Hsiung Tsai;Wei-Chou Chen;Kang-Ping Li;Pei-Chen Yeh;Hsin-Ying Huang
義守大學 2010-10 Relationship between wafer fracture reduction and controlling during the edge manufacturing process Po-Ying Chen;Ming-Hsing Tsai;Wen-Kuan Yeh;Ming-Haw Jing;Yukon Chang
義守大學 2010-02 Relationship between wafer fracture reduction and controlling during the edge manufacturing process Po-Ying Chen; Ming-Hsing Tsai; Wen-Kuan Yeh; Ming-Haw Jing; Yukon Chang
義守大學 2009/12/09 An improvement method for the reliability of copper metallization process Po-Ying Chen ; Po-Han Wu ; Woei Jye Ong
義守大學 2009-12 Investigation of the Relationship between Whole -Wafer Strength and Control of its Edge Engineering Po-Ying Chen;Ming-Hsing Tsai;Wen-Kuan Yeh;Ming-Haw Jing;Yukon Chang
義守大學 2009-08 Development of a brand new system using RFID combining with wireless sensor network (WSNs) for real-time doze alarm Po-Ying Chen;Po-Han Wu;Woei Jye Ong;Yu-Jung Huang;Wei-cheng Lin;Tsung-Long Pan
義守大學 2009-08 Development of a brand new system using RFID combining with wireless sensor network (WSNs) for real-time doze alarm Po-Ying Chen;Po-Han Wu;Woei Jye Ong;Yu-Jung Huang;Wei-cheng Lin;TSung-long Pan
義守大學 2009-03 The Impact of Strain Technology on FUSI Gate SOI CMOSFET Wen-Kuan Yeh;Jean-An Wang;Ming-Hsing Tsai;Chien-Ting Lin;Po-Ying Chen
義守大學 2008/08/20 Dynamic scanning method to clarify the mechanism of WLCSP package reliability issue Po-Ying Chen ; Chwei-Shyong Tsai ; Ming-Hsiung Tsai ; Heng-Yu Kung ; Shen-Li Chen ; Jing, M.H. ; Wen-Kuan Yeh
義守大學 2008/04/27 Effect of crystal-originated particles (COPs) on ULSI process integrity Po-Ying Chen ; Chen, S.L. ; Tsai, M.H. ; Jing, M.H. ; Lin, T.-C. ; Wen-Kuan Yeh
義守大學 2008-12 Degradation of Gate Oxide Integrity by Formation of Tiny Holes by Metal Contamination of Raw Wafer Po-Ying Chen
義守大學 2008-10 Elucidating the effects of current stress history on reliability characteristics by dynamic analysis Po-Ying Chen;Shen-Li Chen;Ming-Hsiung Tsai;Wen-Kuan Yeh;Heng-Yu Kung;YuKon Chang
義守大學 2008-02 Reliability and characteristics of wafer-level chip-scale packages under current stress Po-Ying Chen;Heng-Yu Kung;Yi-Shao Lai;Ming Hsiung Tsai;Wen-Kuan Yeh
義守大學 2008 Characteristics of spontaneous reaction occurred by metal contamination and silicon substrate for ultralarge-scale integration semiconductor process Po-Ying Chen
義守大學 2007/12/20 Investigation of Electrostatic Charges Trapping during 12-Inch Deep Submicron VLSI Proces Po-Ying Chen ; Chen, S.L. ; Tsai, M.H. ; Jing, M.H. ; Lin, T.-C.
義守大學 2007/12/20 Implement of an Improvement Particle Monitoring Methodology in an Industry Production Process Po-Ying Chen ; Chen, S.L. ; Tsai, M.H. ; Jing, M.H. ; Lin, T.-C.
義守大學 2007/12/20 Investigation of Wafer Strength in 12 inch Bare Wafer for Prevent Wafer Breakage Po-Ying Chen ; Jing, M.H. ; Tin, T.C.
義守大學 2007/07/11 The Defects of Silicon Reacted with Carbon Content Vapour in ULSI Nano-meter-Generation Technology Po-Ying Chen ; Shen-Li Chen ; Ming-Hsiung Tsai ; Jing, M.H. ; Lin, T.-C. ; Cheng-Chia Kuo
義守大學 2007/07/11 The Defects of Silicon Reacted with Carbon Content Vapour in ULSI Nano-meter-Generation Technology Po-Ying Chen ; Shen-Li Chen ; Ming-Hsiung Tsai ; Jing, M.H. ; Lin, T.-C. ; Cheng-Chia Kuo
義守大學 2007/07/11 The Failure Mode Investigation of Barrier Layer TaN Combined with Al Pad Architecture using in Cu Process Po-Ying Chen ; Shen-Li Chen ; Ming-Hsiung Tsai ; Jing, M.H. ; Lin, T.-C.
義守大學 2006/12/06 The effect of stressing history in reliability characteristics Po-Ying Chen ; Heng-Yu Kung ; Yi-Shao Lai ; Wen-Kuan Yeh
中原大學 2005-07-28 以BPEL為基礎的服務導向式心臟照護系統之設計與實作 陳柏穎; po-ying chen

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