臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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"po ying chen"

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Showing items 11-20 of 29 (3 Page(s) Totally)
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Institution	Date	Title	Author
義守大學	2009/12/09	An improvement method for the reliability of copper metallization process	Po-Ying Chen ; Po-Han Wu ; Woei Jye Ong
義守大學	2009-12	Investigation of the Relationship between Whole -Wafer Strength and Control of its Edge Engineering	Po-Ying Chen;Ming-Hsing Tsai;Wen-Kuan Yeh;Ming-Haw Jing;Yukon Chang
義守大學	2009-08	Development of a brand new system using RFID combining with wireless sensor network (WSNs) for real-time doze alarm	Po-Ying Chen;Po-Han Wu;Woei Jye Ong;Yu-Jung Huang;Wei-cheng Lin;Tsung-Long Pan
義守大學	2009-08	Development of a brand new system using RFID combining with wireless sensor network (WSNs) for real-time doze alarm	Po-Ying Chen;Po-Han Wu;Woei Jye Ong;Yu-Jung Huang;Wei-cheng Lin;TSung-long Pan
義守大學	2009-03	The Impact of Strain Technology on FUSI Gate SOI CMOSFET	Wen-Kuan Yeh;Jean-An Wang;Ming-Hsing Tsai;Chien-Ting Lin;Po-Ying Chen
義守大學	2008/08/20	Dynamic scanning method to clarify the mechanism of WLCSP package reliability issue	Po-Ying Chen ; Chwei-Shyong Tsai ; Ming-Hsiung Tsai ; Heng-Yu Kung ; Shen-Li Chen ; Jing, M.H. ; Wen-Kuan Yeh
義守大學	2008/04/27	Effect of crystal-originated particles (COPs) on ULSI process integrity	Po-Ying Chen ; Chen, S.L. ; Tsai, M.H. ; Jing, M.H. ; Lin, T.-C. ; Wen-Kuan Yeh
義守大學	2008-12	Degradation of Gate Oxide Integrity by Formation of Tiny Holes by Metal Contamination of Raw Wafer	Po-Ying Chen
義守大學	2008-10	Elucidating the effects of current stress history on reliability characteristics by dynamic analysis	Po-Ying Chen;Shen-Li Chen;Ming-Hsiung Tsai;Wen-Kuan Yeh;Heng-Yu Kung;YuKon Chang
義守大學	2008-02	Reliability and characteristics of wafer-level chip-scale packages under current stress	Po-Ying Chen;Heng-Yu Kung;Yi-Shao Lai;Ming Hsiung Tsai;Wen-Kuan Yeh

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