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教育部委托研究计画 计画执行:国立台湾大学图书馆
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"po ying chen"的相关文件
显示项目 21-29 / 29 (共3页)
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| 義守大學 |
2008 |
Characteristics of spontaneous reaction occurred by metal contamination and silicon substrate for ultralarge-scale integration semiconductor process
|
Po-Ying Chen |
| 義守大學 |
2007/12/20 |
Investigation of Electrostatic Charges Trapping during 12-Inch Deep Submicron VLSI Proces
|
Po-Ying Chen ; Chen, S.L. ; Tsai, M.H. ; Jing, M.H. ; Lin, T.-C. |
| 義守大學 |
2007/12/20 |
Implement of an Improvement Particle Monitoring Methodology in an Industry Production Process
|
Po-Ying Chen ; Chen, S.L. ; Tsai, M.H. ; Jing, M.H. ; Lin, T.-C. |
| 義守大學 |
2007/12/20 |
Investigation of Wafer Strength in 12 inch Bare Wafer for Prevent Wafer Breakage
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Po-Ying Chen ; Jing, M.H. ; Tin, T.C. |
| 義守大學 |
2007/07/11 |
The Defects of Silicon Reacted with Carbon Content Vapour in ULSI Nano-meter-Generation Technology
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Po-Ying Chen ; Shen-Li Chen ; Ming-Hsiung Tsai ; Jing, M.H. ; Lin, T.-C. ; Cheng-Chia Kuo |
| 義守大學 |
2007/07/11 |
The Defects of Silicon Reacted with Carbon Content Vapour in ULSI Nano-meter-Generation Technology
|
Po-Ying Chen ; Shen-Li Chen ; Ming-Hsiung Tsai ; Jing, M.H. ; Lin, T.-C. ; Cheng-Chia Kuo |
| 義守大學 |
2007/07/11 |
The Failure Mode Investigation of Barrier Layer TaN Combined with Al Pad Architecture using in Cu Process
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Po-Ying Chen ; Shen-Li Chen ; Ming-Hsiung Tsai ; Jing, M.H. ; Lin, T.-C. |
| 義守大學 |
2006/12/06 |
The effect of stressing history in reliability characteristics
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Po-Ying Chen ; Heng-Yu Kung ; Yi-Shao Lai ; Wen-Kuan Yeh |
| 中原大學 |
2005-07-28 |
以BPEL為基礎的服務導向式心臟照護系統之設計與實作
|
陳柏穎; po-ying chen |
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