臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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	Repositories
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	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

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Institution	Date	Title	Author
義守大學	2015-04	Linear Time Approximation Algorithms for the Relay Node Placement Problem in Wireless Sensor Networks with Hexagon Tessellation	Chi-Chang Chen;Chi-Yu Chang;Po-Ying Chen
義守大學	2014-11	Using Capacitance Sensor to Extract Characteristic Signals of Dozing from Skin Surface	Po-Ying Chen;Chi-Chang Chen;Wen-Kuan Yeh;Yukan Chang;Der-Chen Huang;Shyr-Shen Yu;Chwei-Shyong Tsai;Yu-Jung Huang;Wei-Cheng Lin;Shao-I Chu;Chung-Long Pan;Tsung-Hung Lin;Shyh-Chang Liu
義守大學	2013-08	Relative Location Estimation over Wireless Sensor Networks with Principal Component Analysis Technique	Shao-I Chu;Chih-Yuan Lien;Wei-Cheng Lin;Yu-Jung Huang;Chung-Long Pan;Po-Ying Chen
義守大學	2013-02	The impact of interface/border defect on performance and reliability of high-k/metal-gate CMOSFET	Wen-Kuan Yeh;Po-Ying Chen;Kwang-Jow Gan;Jer-Chyi Wang;Chao Sung Lai
義守大學	2012-11	Lightweight authentication scheme for wireless sensor networks	Chih-Hung Huang;HsuanHsun Wu;Yu-Jung Huang;Wei-Cheng Lin;Chung-Long Pan;Shao-I Chu;Po-Ying Chen
義守大學	2011-03	The Improvement of High-k/Metal Gate pMOSFET Performance and Reliability using Optimized Si cap/SiGe Channel Structure	Wen-Kuan Yeh;Yu-Ting Chen;Fon-Shan Huang;Chia-Wei Hsu;Chun-Yu Chen;Yean-Kuen Fang;Kwang-Jow Gan;Po-Ying Chen
義守大學	2010-11	Relationship between wafer edge design and its ultimate mechanical strength	Po-Ying Chen ;Ming-Hsing Tsai;Wen-Kuan Yeh;Ming-Haw Jing;Yukon Chang
義守大學	2010-11	Characteristics between Electrical Properties and Controlling of Oxygen Precipitations during ULSI Process	Po-Ying Chen;Shih-Chun Hung;Wen-Kuan Yeh;Ming Hsiung Tsai;Wei-Chou Chen;Kang-Ping Li;Pei-Chen Yeh;Hsin-Ying Huang
義守大學	2010-10	Relationship between wafer fracture reduction and controlling during the edge manufacturing process	Po-Ying Chen;Ming-Hsing Tsai;Wen-Kuan Yeh;Ming-Haw Jing;Yukon Chang
義守大學	2010-02	Relationship between wafer fracture reduction and controlling during the edge manufacturing process	Po-Ying Chen; Ming-Hsing Tsai; Wen-Kuan Yeh; Ming-Haw Jing; Yukon Chang

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