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Institution Date Title Author
國立臺灣科技大學 2005 Non-destructive, room temperature characterization of wafer-sized III-V semiconductor device structures using contactless electromodulation and wavelength-modulated surface photovoltage spectroscopy Huang Y.S.; Pollak F.H.
國立臺灣大學 1997-01 Temperature dependence of the energies and broadening parameters of the interband transitions in Ga0.95Al0.05N Malikova, L.; Huang, Y.-S.; Pollak, F.H.; Feng, Z.C.; Schurman, M.; Tran, C.A.; Salagaj, T.; Stall, R.A.

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