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Institution Date Title Author
國立中山大學 2005 Microwave-assisted volatilization of silicon fluorides for the determination of trace impurities in high purity silicon powder and quartz by ICP-MS R.L. Ueng; S.J. Jiang; C.C. Wan; A.C. Sahayam
國立中山大學 2004 Microwave-assisted volatilization of chlorides of Ge and Se for the determination of trace impurities in high purity Ge and Se by ICP-MS R.L. Ueng; A.C. Sahayam; S.J. Jiang; C.C. Wan

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