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Institution	Date	Title	Author
國立臺灣海洋大學	2013-06	Relationship between microstructure and notch tensile strength in Ti-15V-3Cr-3Al-3Sn alloy at elevated temperature	R.-T. Huang; W.-H. Chen; L. W. Tsay
國立臺灣海洋大學	2012-08	Air-Oxidation Behavior of a [(Co50Cr15Mo14C15B6)97.5Er2.5]93Fe7 Bulk-Metallic Glass at 873 K to 973 K (600 °C to 700 °C)	W. Kai; Y.H. Wu; W.S. Chen; R.T. Huang; H. Jia; P.K. Liaw; T. Zhang
國立臺灣海洋大學	2012-04	Facile Synthesis of Silver Nanoparticles by Electrochemical Method in the Presence of Sodium Montmorillonite	Rong-Hsin Huang; Wen-Kai Chao; Ruei-Sung Yu; R. T. Huang; Kan-Lin Hsueh; Fuh-Sheng Shieu
國立臺灣海洋大學	2011-12	Air-oxidation of a Co-based amorphous ribbon at 400-600oC	Wu Kai;P.C. Lin;W.S. Chen;P.C. Kao;R.T. Huang;P.K. Liaw;; 開物
國立臺灣海洋大學	2011-06	Air-oxidation of a Co-based amorphous ribbon at 400–600 °C	W. Kai;P.C. Lin;W.S. Chen;P.C. Kao;R.T. Huang;P.K. Liaw
國立臺灣海洋大學	2011-02	Zr-based glass-forming film for fatigue-property improvements of 316L stainless steel: Annealing effects	J. P. Chu; C. M. Lee; R. T. Huang; P. K. Liaw
國立臺灣海洋大學	2011-01	(In, Mn)As nanowires with ultrahigh Mn concentration: Growth, morphology and magnetic anisotropy	F. Xu; P. W. Huang; J. H. Huang; R. T. Huang; W. N. Lee; T. S. Chin; Y. W. Du
國立臺灣海洋大學	2010-06	A TEM investigation of retained defects in Si wafer by 1 MeV Si ions bombardment	J. Y. Hsu; R. T. Huang; M. J. Hung; Y.C. Yu
國立臺灣海洋大學	2010-02	Electrical Characterization and Transmission Electron Microscopy Assessment of Isolation of AlGaN/GaN High Electron Mobility Transistors with Oxygen Ion Implantation	Jin-Yu Shiu; Chung-Yu Lu; Ting-Yi Su; R. T. Huang; Herbert Zirath; Niklas Rorsman; Edward Yi Chang
國立臺灣海洋大學	2009-12	Effect of annealing on atomic ordering of amorphous ZrTaTiNbSi alloy	T. –H. Yan; R. T. Huang; C. A. Wu; F. R. Chen; J. Y. Gan; J. W. Yeh; J. Narayan
國立臺灣海洋大學	2009-04	The oxidation behavior of an Fe61B15Zr8Mo7Co5Y2Cr2 bulk metallic glass at 550–700 °C	Wu Kai;I.F. Ren;P.C. Kao;R.T. Huang;C.T. Liu
國立臺灣海洋大學	2009-01	Bulk nano-crystalline alloys	T.-S. Chin;C.Y. Lin;M.C. Lee;R.T. Huang;S.M. Huang
國立臺灣海洋大學	2008-05	The effect of sensitization on the hydrogen-enhanced fatigue crack growth of two austenitic stainless steels	L. W. Tsay;Y. F. Liua;R. T. Huang;R. C. Kuo
國立臺灣海洋大學	2008-01	Bulk nano-crystalline Fe-based alloys by annealing bulk glassy precursors	T. S. Chin;C. Y. Lin;M. C. Lee;R. T. Huang;S. M. Huang
國立臺灣海洋大學	2007-10-01	Air-Oxidation Behavior of a Cu60Hf25Ti15 Bulk Metallic Glass at 375–520°C	W. Kai;H. H. Hsieh;T. H. Ho;R. T. Huang;Y. L. Lin
國立臺灣海洋大學	2007-08	Air-Oxidation Behavior of a Cu60Hf25Ti15 Bulk Metallic Glass at 375–520 oC	W. Kai; H. H. Hsieh; T. H. Ho; R. T. Huang; Y. L. Lin; D. C. Qiao; P. K. Liaw
國立臺灣海洋大學	2007-07	Effect of austenite instability on the hydrogen-enhanced crack growth of austenitic stainless steels	L.W. Tsay;S.C. Yu;R.-T. Huang
國立臺灣海洋大學	2007-06	Room-temperature fabricated ZnCoO diluted magnetic semiconductors	H. H. Huang; C. A. Yang; P. H. Huang; C. H. Lai; T. S. Chin; H. E. Huang; H. Y. Bor; R. T. Huang
國立臺灣海洋大學	2007-04-01	The oxidation behavior of Cu–Zr–Ti–base bulk metallic glasses in air at 350–500 °C	H. H. Hsieh;W. Kai;W. L. Jang;R. T. Huang;P. Y. Lee;W. H. Wang
國立臺灣海洋大學	2007-04	The oxidation behavior of Cu–Zr–Ti–base bulk metallic glasses in air at 350–500 oC	H. H. Hsieh; W. Kai; W. L. Jang; R. T. Huang; P. Y. Lee; W. H. Wang
國立臺灣海洋大學	2007	Air Oxidation of an Fe48Cr15C15Mo14B6Er2 Bulk Metallic Glass at 600–725°C	H. H. Hsieh;W. Kai;R. T. Huang;D. C. Qiao;P. K. Liaw
國立臺灣海洋大學	2007	Room-temperature fabricated ZnCoO diluted magnetic semiconductors	Hsin-Hung Huang;Chih-An Yang;Po-Hsiang Huang; Chih-Huang Lai;T. S. Chin;H. E. Huang;H. Y. Bor;R. T. Huang
國立臺灣海洋大學	2007	Room-temperature ferromagnetism in self-assembled (In, Mn)As quantum dots	Y. F. Chen;J. H. Huang;W. N. Lee;T. S. Chin;R. T. Huang;F. R. Chen;J. J. Kai;H. C. Ku
國立臺灣海洋大學	2006-08	Air oxidation of an Fe72B22Y6 bulk amorphous alloy at 600–700 °C	H. H. Hsieh;W. Kai;R. T. Huang;C. Y. Lin;T. S. Chin
國立臺灣海洋大學	2006-08	Compressive Deformation of a Bulk Ce-Based Metallic Glass	J. P. Chu;C. L. Chiang;H. Wijaya;R. T. Huang;C. W. Wu;B. Zhang;W. H. Wang;T. G. Nieh

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