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Institution Date Title Author
國立中山大學 2004 Relationships among equivalent oxide thickness, nanochemistry, and nanostructure in atomic layer chemical-vapor-deposited Hf-O films on Si S.K. Dey;A. Das;M. Tsai;D. Gu;M. Floyd;R.W. Carpenter;H. De Waard;C. Werkhoven;S. Marcus
國立彰化師範大學 1991 High-Resolution Electron Microscopy and Microanalysis of CdS and CdTe Quantum Dots in Glass Matrices Liu, Li‐Chi; M. J. Kim; Subhash H. Risbudand; R. W. Carpenter
國立彰化師範大學 1990 Nanostructure of Semiconductor Quantum Dots in a Borosilicate Glass Matrix by Complementary Use of HREM and AEM M. J. Kim; Liu, Li‐Chi; S. H. Risbud; R. W. Carpenter

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