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"reuter w"
Showing items 1-2 of 2 (1 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:06:25Z |
CHARACTERIZATION OF MONOLITHIC POLYCRYSTALLINE-SILICON RESISTORS IN SUB-MICRON THICKNESS
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LU, NCC; LU, CY; LEE, MK; SHIH, CC; WANG, CS; SHENG, TT; REUTER, W |
| 國立交通大學 |
2014-12-08T15:06:17Z |
THE EFFECT OF FILM THICKNESS ON THE ELECTRICAL-PROPERTIES OF LPCVD POLYSILICON FILMS
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LU, NCC; LU, CY; LEE, MK; SHIH, CC; WANG, CS; REUTER, W; SHENG, TT |
Showing items 1-2 of 2 (1 Page(s) Totally)
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