臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

About TAIR
	About TAIR

Browse By
	Institution
	Author
	Title
	Date
	Statistics Chart
	Institution Facts
	Trend

News
	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

Copyright
	Publisher & Journal Policy
	TAIR Copyright Conference Minutes

Related Links
	機構典藏計畫網站
	ROAR
	OpenDOAR
	SHERPA
	OAIster
	JAIRO
	Ira
	DSPACE
	RWWR
	臺大學術典藏NTU Scholars

"ruey shan guo"

Return to Browse by Author
Sorting by Title	Sort by Date

Showing items 176-225 of 430 (9 Page(s) Totally)
<< < 1 2 3 4 5 6 7 8 9 > >>
View [10|25|50] records per page

Institution	Date	Title	Author
臺大學術典藏	2018-09-10T07:10:40Z	An Enhanced Algorithm to Integrate Statistical Process Monitoring and Feedback Adjustment	RUEY-SHAN GUO;K. Wu;A. Chen; RUEY-SHAN GUO; K. Wu; A. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:40Z	An Enhanced Algorithm to Integrate Statistical Process Monitoring and Feedback Adjustment	RUEY-SHAN GUO;K. Wu;A. Chen; RUEY-SHAN GUO; K. Wu; A. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:40Z	An Enhanced Algorithm to Integrate Statistical Process Monitoring and Feedback Adjustment	RUEY-SHAN GUO;K. Wu;A. Chen; RUEY-SHAN GUO; K. Wu; A. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:40Z	An Integrated Approach to Semiconductor Equipment Monitoring	RUEY-SHAN GUO;A. Yang;A. Chen; RUEY-SHAN GUO; A. Yang; A. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:40Z	An Integrated Approach to Semiconductor Equipment Monitoring	RUEY-SHAN GUO;A. Yang;A. Chen; RUEY-SHAN GUO; A. Yang; A. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:40Z	An Integrated Approach to Semiconductor Equipment Monitoring	RUEY-SHAN GUO;A. Yang;A. Chen; RUEY-SHAN GUO; A. Yang; A. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:39Z	Statistical Monitoring of Thickness Data Using Bivariate Runs Rules	RUEY-SHAN GUO;C. Lee;A. Chen; RUEY-SHAN GUO; C. Lee; A. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:39Z	Statistical Monitoring of Thickness Data Using Bivariate Runs Rules	RUEY-SHAN GUO;C. Lee;A. Chen; RUEY-SHAN GUO; C. Lee; A. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:39Z	Statistical Monitoring of Thickness Data Using Bivariate Runs Rules	RUEY-SHAN GUO;C. Lee;A. Chen; RUEY-SHAN GUO; C. Lee; A. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:39Z	An Integrated Fault Detection Scheme for Wafer Acceptance Test Data	RUEY-SHAN GUO;S. Chang;C. Fan; RUEY-SHAN GUO; S. Chang; C. Fan; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:39Z	An Integrated Fault Detection Scheme for Wafer Acceptance Test Data	RUEY-SHAN GUO;S. Chang;C. Fan; RUEY-SHAN GUO; S. Chang; C. Fan; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:39Z	An Integrated Fault Detection Scheme for Wafer Acceptance Test Data	RUEY-SHAN GUO;S. Chang;C. Fan; RUEY-SHAN GUO; S. Chang; C. Fan; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:39Z	Runs Rules for Bivariate Shewhart Chart	RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:39Z	Runs Rules for Bivariate Shewhart Chart	RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:39Z	Runs Rules for Bivariate Shewhart Chart	RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:39Z	A Real-time Equipment Monitoring and Fault Detection System	RUEY-SHAN GUO;C. Tseng;A. Chen;R. Guo; RUEY-SHAN GUO; C. Tseng; A. Chen; R. Guo; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:39Z	A Real-time Equipment Monitoring and Fault Detection System	RUEY-SHAN GUO;C. Tseng;A. Chen;R. Guo; RUEY-SHAN GUO; C. Tseng; A. Chen; R. Guo; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:39Z	A Real-time Equipment Monitoring and Fault Detection System	RUEY-SHAN GUO;C. Tseng;A. Chen;R. Guo; RUEY-SHAN GUO; C. Tseng; A. Chen; R. Guo; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	The Effects of Supplier’s Use of Power on Cooperation Climate Inter-firm Trust and Buyer’s Commitment	RUEY-SHAN GUO;F. Pai;D. Chiang; RUEY-SHAN GUO; F. Pai; D. Chiang; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	The Effects of Supplier’s Use of Power on Cooperation Climate Inter-firm Trust and Buyer’s Commitment	RUEY-SHAN GUO;F. Pai;D. Chiang; RUEY-SHAN GUO; F. Pai; D. Chiang; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	The Effects of Supplier’s Use of Power on Cooperation Climate Inter-firm Trust and Buyer’s Commitment	RUEY-SHAN GUO;F. Pai;D. Chiang; RUEY-SHAN GUO; F. Pai; D. Chiang; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	Supply Chain Integration and its Determinants	RUEY-SHAN GUO;D. Chiang;F. Pai; RUEY-SHAN GUO; D. Chiang; F. Pai; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	Supply Chain Integration and its Determinants	RUEY-SHAN GUO;D. Chiang;F. Pai; RUEY-SHAN GUO; D. Chiang; F. Pai; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	Supply Chain Integration and its Determinants	RUEY-SHAN GUO;D. Chiang;F. Pai; RUEY-SHAN GUO; D. Chiang; F. Pai; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	Exploratory Study on Emerging Integrator Business Model in Engineering Chain of the Semiconductor Industry: Re-integration of Vertical Disintegration	RUEY-SHAN GUO;D. Kao;C. Lo;Y. Su; RUEY-SHAN GUO; D. Kao; C. Lo; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	Exploratory Study on Emerging Integrator Business Model in Engineering Chain of the Semiconductor Industry: Re-integration of Vertical Disintegration	RUEY-SHAN GUO;D. Kao;C. Lo;Y. Su; RUEY-SHAN GUO; D. Kao; C. Lo; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	Exploratory Study on Emerging Integrator Business Model in Engineering Chain of the Semiconductor Industry: Re-integration of Vertical Disintegration	RUEY-SHAN GUO;D. Kao;C. Lo;Y. Su; RUEY-SHAN GUO; D. Kao; C. Lo; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	Manufacturing Service Creation and Management for Next Generation Virtual Fab	RUEY-SHAN GUO;Y. Lai;T. Chou;S. Chang;Y. Su; RUEY-SHAN GUO; Y. Lai; T. Chou; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	Manufacturing Service Creation and Management for Next Generation Virtual Fab	RUEY-SHAN GUO;Y. Lai;T. Chou;S. Chang;Y. Su; RUEY-SHAN GUO; Y. Lai; T. Chou; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	Manufacturing Service Creation and Management for Next Generation Virtual Fab	RUEY-SHAN GUO;Y. Lai;T. Chou;S. Chang;Y. Su; RUEY-SHAN GUO; Y. Lai; T. Chou; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	A Self-tuning EWMA Controller for Processes subject to Small and Large Disturbances	J. Chen; RUEY-SHAN GUO; RUEY-SHAN GUO;S. Lu;A. Chen;R. Guo;J. Chen; RUEY-SHAN GUO; S. Lu; A. Chen; R. Guo
臺大學術典藏	2018-09-10T07:10:38Z	A Self-tuning EWMA Controller for Processes subject to Small and Large Disturbances	J. Chen; RUEY-SHAN GUO; RUEY-SHAN GUO;S. Lu;A. Chen;R. Guo;J. Chen; RUEY-SHAN GUO; S. Lu; A. Chen; R. Guo
臺大學術典藏	2018-09-10T07:10:38Z	A Self-tuning EWMA Controller for Processes subject to Small and Large Disturbances	J. Chen; RUEY-SHAN GUO; RUEY-SHAN GUO;S. Lu;A. Chen;R. Guo;J. Chen; RUEY-SHAN GUO; S. Lu; A. Chen; R. Guo
臺大學術典藏	2018-09-10T06:39:20Z	Optimizing Fund Allocation by Considering RAROC	David M. Chiang; Ruey-Shan Guo; Chia-Yin Chen; MING-HUANG CHIANG
臺大學術典藏	2018-09-10T06:39:20Z	Stochastic Modeling and Validation of Inter-Purchase Time for Customer	Ruey-Shan Guo;David M. Chiang;Yi-Fen Chen;Jia-Ying Chen; Ruey-Shan Guo; David M. Chiang; Yi-Fen Chen; Jia-Ying Chen; MING-HUANG CHIANG
臺大學術典藏	2018-09-10T06:39:20Z	Stochastic Modeling and Validation of Inter-Purchase Time for Customer	Ruey-Shan Guo;David M. Chiang;Yi-Fen Chen;Jia-Ying Chen; Ruey-Shan Guo; David M. Chiang; Yi-Fen Chen; Jia-Ying Chen; MING-HUANG CHIANG
臺大學術典藏	2018-09-10T06:39:20Z	The Relationship between Bargaining Power, Vendor Selection Practice and Performance in Semiconductor Supply Chain	Fan-Yun Pai;Ruey-Shan Guo;David M. Chiang; Fan-Yun Pai; Ruey-Shan Guo; David M. Chiang; MING-HUANG CHIANG
臺大學術典藏	2018-09-10T06:39:20Z	The Relationship between Bargaining Power, Vendor Selection Practice and Performance in Semiconductor Supply Chain	Fan-Yun Pai;Ruey-Shan Guo;David M. Chiang; Fan-Yun Pai; Ruey-Shan Guo; David M. Chiang; MING-HUANG CHIANG
臺大學術典藏	2018-09-10T06:39:19Z	A WIP-based exception-management model for integrated circuit back-end production processes"	MING-HUANG CHIANG; RUEY-SHAN GUO; MING-HUANG CHIANG; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:19Z	A WIP-based exception-management model for integrated circuit back-end production processes"	MING-HUANG CHIANG; RUEY-SHAN GUO; MING-HUANG CHIANG; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:19Z	Multi-objectives exception management model for semiconductor back-end environment under turnkey service"	MING-HUANG CHIANG; RUEY-SHAN GUO; MING-HUANG CHIANG; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:19Z	Multi-objectives exception management model for semiconductor back-end environment under turnkey service"	MING-HUANG CHIANG; RUEY-SHAN GUO; MING-HUANG CHIANG; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	Real Competitiveness via Virtual Fab	RUEY-SHAN GUO;T. Chou;Y. Lee;S. Chang;Y. Su; RUEY-SHAN GUO; T. Chou; Y. Lee; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	Real Competitiveness via Virtual Fab	RUEY-SHAN GUO;T. Chou;Y. Lee;S. Chang;Y. Su; RUEY-SHAN GUO; T. Chou; Y. Lee; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	Real Competitiveness via Virtual Fab	RUEY-SHAN GUO;T. Chou;Y. Lee;S. Chang;Y. Su; RUEY-SHAN GUO; T. Chou; Y. Lee; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	An Integrated Wafer Acceptance Test Scheme in Semiconductor Manufacturing	RUEY-SHAN GUO;C. Tsai;J. Fan,;S. Chang; RUEY-SHAN GUO; C. Tsai; J. Fan,; S. Chang; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	An Integrated Wafer Acceptance Test Scheme in Semiconductor Manufacturing	RUEY-SHAN GUO;C. Tsai;J. Fan,;S. Chang; RUEY-SHAN GUO; C. Tsai; J. Fan,; S. Chang; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	An Integrated Wafer Acceptance Test Scheme in Semiconductor Manufacturing	RUEY-SHAN GUO;C. Tsai;J. Fan,;S. Chang; RUEY-SHAN GUO; C. Tsai; J. Fan,; S. Chang; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	An Adaptive Process Controller for Semiconductor Manufacturing	RUEY-SHAN GUO;L. Huang;S. Wang;J. Chen; RUEY-SHAN GUO; L. Huang; S. Wang; J. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	An Adaptive Process Controller for Semiconductor Manufacturing	RUEY-SHAN GUO;L. Huang;S. Wang;J. Chen; RUEY-SHAN GUO; L. Huang; S. Wang; J. Chen; RUEY-SHAN GUO

Showing items 176-225 of 430 (9 Page(s) Totally)
<< < 1 2 3 4 5 6 7 8 9 > >>
View [10|25|50] records per page

	English \| 正體中文 \| 简体中文 \| Total items :2822924
	Visitors : 30057335 Online Users : 968 Project Commissioned by the Ministry of Education Project Executed by National Taiwan University Library