| 臺大學術典藏 |
2018-09-10T06:39:20Z |
Stochastic Modeling and Validation of Inter-Purchase Time for Customer
|
Ruey-Shan Guo;David M. Chiang;Yi-Fen Chen;Jia-Ying Chen; Ruey-Shan Guo; David M. Chiang; Yi-Fen Chen; Jia-Ying Chen; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T06:39:20Z |
The Relationship between Bargaining Power, Vendor Selection Practice and Performance in Semiconductor Supply Chain
|
Fan-Yun Pai;Ruey-Shan Guo;David M. Chiang; Fan-Yun Pai; Ruey-Shan Guo; David M. Chiang; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T06:39:20Z |
The Relationship between Bargaining Power, Vendor Selection Practice and Performance in Semiconductor Supply Chain
|
Fan-Yun Pai;Ruey-Shan Guo;David M. Chiang; Fan-Yun Pai; Ruey-Shan Guo; David M. Chiang; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T06:39:19Z |
A WIP-based exception-management model for integrated circuit back-end production processes"
|
MING-HUANG CHIANG; RUEY-SHAN GUO; MING-HUANG CHIANG; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:39:19Z |
A WIP-based exception-management model for integrated circuit back-end production processes"
|
MING-HUANG CHIANG; RUEY-SHAN GUO; MING-HUANG CHIANG; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:39:19Z |
Multi-objectives exception management model for semiconductor back-end environment under turnkey service"
|
MING-HUANG CHIANG; RUEY-SHAN GUO; MING-HUANG CHIANG; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:39:19Z |
Multi-objectives exception management model for semiconductor back-end environment under turnkey service"
|
MING-HUANG CHIANG; RUEY-SHAN GUO; MING-HUANG CHIANG; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:39:00Z |
Real Competitiveness via Virtual Fab
|
RUEY-SHAN GUO;T. Chou;Y. Lee;S. Chang;Y. Su; RUEY-SHAN GUO; T. Chou; Y. Lee; S. Chang; Y. Su; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:39:00Z |
Real Competitiveness via Virtual Fab
|
RUEY-SHAN GUO;T. Chou;Y. Lee;S. Chang;Y. Su; RUEY-SHAN GUO; T. Chou; Y. Lee; S. Chang; Y. Su; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:39:00Z |
Real Competitiveness via Virtual Fab
|
RUEY-SHAN GUO;T. Chou;Y. Lee;S. Chang;Y. Su; RUEY-SHAN GUO; T. Chou; Y. Lee; S. Chang; Y. Su; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:39:00Z |
An Integrated Wafer Acceptance Test Scheme in Semiconductor Manufacturing
|
RUEY-SHAN GUO;C. Tsai;J. Fan,;S. Chang; RUEY-SHAN GUO; C. Tsai; J. Fan,; S. Chang; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:39:00Z |
An Integrated Wafer Acceptance Test Scheme in Semiconductor Manufacturing
|
RUEY-SHAN GUO;C. Tsai;J. Fan,;S. Chang; RUEY-SHAN GUO; C. Tsai; J. Fan,; S. Chang; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:39:00Z |
An Integrated Wafer Acceptance Test Scheme in Semiconductor Manufacturing
|
RUEY-SHAN GUO;C. Tsai;J. Fan,;S. Chang; RUEY-SHAN GUO; C. Tsai; J. Fan,; S. Chang; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:39:00Z |
An Adaptive Process Controller for Semiconductor Manufacturing
|
RUEY-SHAN GUO;L. Huang;S. Wang;J. Chen; RUEY-SHAN GUO; L. Huang; S. Wang; J. Chen; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:39:00Z |
An Adaptive Process Controller for Semiconductor Manufacturing
|
RUEY-SHAN GUO;L. Huang;S. Wang;J. Chen; RUEY-SHAN GUO; L. Huang; S. Wang; J. Chen; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:39:00Z |
An Adaptive Process Controller for Semiconductor Manufacturing
|
RUEY-SHAN GUO;L. Huang;S. Wang;J. Chen; RUEY-SHAN GUO; L. Huang; S. Wang; J. Chen; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:39:00Z |
Design and Implementation of an Active Furnace Monitoring System in Semiconductor Manufacturing
|
RUEY-SHAN GUO;S. Chang;C. Tseng;W. Mao; RUEY-SHAN GUO; S. Chang; C. Tseng; W. Mao; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:39:00Z |
Design and Implementation of an Active Furnace Monitoring System in Semiconductor Manufacturing
|
RUEY-SHAN GUO;S. Chang;C. Tseng;W. Mao; RUEY-SHAN GUO; S. Chang; C. Tseng; W. Mao; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:39:00Z |
Design and Implementation of an Active Furnace Monitoring System in Semiconductor Manufacturing
|
RUEY-SHAN GUO;S. Chang;C. Tseng;W. Mao; RUEY-SHAN GUO; S. Chang; C. Tseng; W. Mao; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:39:00Z |
生產與作業管理
|
RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:39:00Z |
生產與作業管理
|
RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:39:00Z |
生產與作業管理
|
RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:59Z |
Evolutionary Business Models and Inter-Firm Engineering Processes between the Foundry and Fabless in the Semiconductor Industry
|
RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:59Z |
Evolutionary Business Models and Inter-Firm Engineering Processes between the Foundry and Fabless in the Semiconductor Industry
|
RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:59Z |
Evolutionary Business Models and Inter-Firm Engineering Processes between the Foundry and Fabless in the Semiconductor Industry
|
RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:59Z |
Stochastic Modeling and Validation of Inter-purchase Time for Customer Relationship Management
|
RUEY-SHAN GUO;J. Chen;Y. Chen,;D. Chiang; RUEY-SHAN GUO; J. Chen; Y. Chen,; D. Chiang; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:59Z |
Stochastic Modeling and Validation of Inter-purchase Time for Customer Relationship Management
|
RUEY-SHAN GUO;J. Chen;Y. Chen,;D. Chiang; RUEY-SHAN GUO; J. Chen; Y. Chen,; D. Chiang; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:59Z |
Stochastic Modeling and Validation of Inter-purchase Time for Customer Relationship Management
|
RUEY-SHAN GUO;J. Chen;Y. Chen,;D. Chiang; RUEY-SHAN GUO; J. Chen; Y. Chen,; D. Chiang; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:59Z |
Inter-firm Engineering Processes and Business Models between Foundry and Fabless in Semiconductor Industry,”
|
RUEY-SHAN GUO;F. Pai;S. Chiu;Y. Su; RUEY-SHAN GUO; F. Pai; S. Chiu; Y. Su; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:59Z |
Inter-firm Engineering Processes and Business Models between Foundry and Fabless in Semiconductor Industry,”
|
RUEY-SHAN GUO;F. Pai;S. Chiu;Y. Su; RUEY-SHAN GUO; F. Pai; S. Chiu; Y. Su; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:59Z |
Inter-firm Engineering Processes and Business Models between Foundry and Fabless in Semiconductor Industry,”
|
RUEY-SHAN GUO;F. Pai;S. Chiu;Y. Su; RUEY-SHAN GUO; F. Pai; S. Chiu; Y. Su; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:59Z |
“Cooperative Buyer-Vendor Relationships for Custom Integrated Circuits Manufacturing,”
|
RUEY-SHAN GUO;D. Chiang;R. Guo,;F. Pai; RUEY-SHAN GUO; D. Chiang; R. Guo,; F. Pai; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:59Z |
“Cooperative Buyer-Vendor Relationships for Custom Integrated Circuits Manufacturing,”
|
RUEY-SHAN GUO;D. Chiang;R. Guo,;F. Pai; RUEY-SHAN GUO; D. Chiang; R. Guo,; F. Pai; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:59Z |
“Cooperative Buyer-Vendor Relationships for Custom Integrated Circuits Manufacturing,”
|
RUEY-SHAN GUO;D. Chiang;R. Guo,;F. Pai; RUEY-SHAN GUO; D. Chiang; R. Guo,; F. Pai; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:59Z |
Monitoring and Control of Echelon Inventory in Semiconductor Manufacturing
|
RUEY-SHAN GUO;D. Chiang; RUEY-SHAN GUO; D. Chiang; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:59Z |
Monitoring and Control of Echelon Inventory in Semiconductor Manufacturing
|
RUEY-SHAN GUO;D. Chiang; RUEY-SHAN GUO; D. Chiang; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:59Z |
Monitoring and Control of Echelon Inventory in Semiconductor Manufacturing
|
RUEY-SHAN GUO;D. Chiang; RUEY-SHAN GUO; D. Chiang; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:58Z |
Customer Satisfaction Improvement with a Hybrid Dispatching Rule in Semiconductor Back-end Factories
|
RUEY-SHAN GUO;D. Chiang;F. Pai; RUEY-SHAN GUO; D. Chiang; F. Pai; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:58Z |
Customer Satisfaction Improvement with a Hybrid Dispatching Rule in Semiconductor Back-end Factories
|
RUEY-SHAN GUO;D. Chiang;F. Pai; RUEY-SHAN GUO; D. Chiang; F. Pai; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:58Z |
Customer Satisfaction Improvement with a Hybrid Dispatching Rule in Semiconductor Back-end Factories
|
RUEY-SHAN GUO;D. Chiang;F. Pai; RUEY-SHAN GUO; D. Chiang; F. Pai; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:34Z |
Design of Supply Chain Contract by Consideration of Risk Pooling and Risk Sharing
|
Ruey-Shan Guo;David M. Chiang;Hung-Jen Lo;Fan-Yun Pai; Ruey-Shan Guo; David M. Chiang; Hung-Jen Lo; Fan-Yun Pai; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T06:04:34Z |
Design of Supply Chain Contract by Consideration of Risk Pooling and Risk Sharing
|
Ruey-Shan Guo;David M. Chiang;Hung-Jen Lo;Fan-Yun Pai; Ruey-Shan Guo; David M. Chiang; Hung-Jen Lo; Fan-Yun Pai; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T06:04:34Z |
Take-Or-Pay Supply Chain Contract under Market Price Volatility
|
David M. Chiang;Ruey-Shan Guo;Ming-Hsien Chen;Fan-Yun Pai; David M. Chiang; Ruey-Shan Guo; Ming-Hsien Chen; Fan-Yun Pai; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T06:04:34Z |
Take-Or-Pay Supply Chain Contract under Market Price Volatility
|
David M. Chiang;Ruey-Shan Guo;Ming-Hsien Chen;Fan-Yun Pai; David M. Chiang; Ruey-Shan Guo; Ming-Hsien Chen; Fan-Yun Pai; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T06:04:34Z |
Sensitivity Analysis of a Quadratic Goal Programming Model for Semiconductor Supply Chain
|
David M. Chiang;Ruey-Shan Guo;Argon Chen;Cheng-Bang Chen; David M. Chiang; Ruey-Shan Guo; Argon Chen; Cheng-Bang Chen; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T06:04:34Z |
Sensitivity Analysis of a Quadratic Goal Programming Model for Semiconductor Supply Chain
|
David M. Chiang;Ruey-Shan Guo;Argon Chen;Cheng-Bang Chen; David M. Chiang; Ruey-Shan Guo; Argon Chen; Cheng-Bang Chen; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T06:04:34Z |
Supply Chain CONWIP Inventory Control in Semiconductor Manufacturing
|
Ruey-Shan Guo;David Chiang; Ruey-Shan Guo; David Chiang; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T06:04:34Z |
Supply Chain CONWIP Inventory Control in Semiconductor Manufacturing
|
Ruey-Shan Guo;David Chiang; Ruey-Shan Guo; David Chiang; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T06:04:18Z |
Intelligent IC Fabrication Diagnosis System
|
RUEY-SHAN GUO;S. Chang,;J. Lee;C. Tsai;R. Gu; RUEY-SHAN GUO; S. Chang,; J. Lee; C. Tsai; R. Gu; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:18Z |
Intelligent IC Fabrication Diagnosis System
|
RUEY-SHAN GUO;S. Chang,;J. Lee;C. Tsai;R. Gu; RUEY-SHAN GUO; S. Chang,; J. Lee; C. Tsai; R. Gu; RUEY-SHAN GUO |
