臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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显示项目 201-225 / 430 (共18页)
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机构	日期	题名	作者
臺大學術典藏	2018-09-10T07:10:38Z	Exploratory Study on Emerging Integrator Business Model in Engineering Chain of the Semiconductor Industry: Re-integration of Vertical Disintegration	RUEY-SHAN GUO;D. Kao;C. Lo;Y. Su; RUEY-SHAN GUO; D. Kao; C. Lo; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	Exploratory Study on Emerging Integrator Business Model in Engineering Chain of the Semiconductor Industry: Re-integration of Vertical Disintegration	RUEY-SHAN GUO;D. Kao;C. Lo;Y. Su; RUEY-SHAN GUO; D. Kao; C. Lo; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	Manufacturing Service Creation and Management for Next Generation Virtual Fab	RUEY-SHAN GUO;Y. Lai;T. Chou;S. Chang;Y. Su; RUEY-SHAN GUO; Y. Lai; T. Chou; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	Manufacturing Service Creation and Management for Next Generation Virtual Fab	RUEY-SHAN GUO;Y. Lai;T. Chou;S. Chang;Y. Su; RUEY-SHAN GUO; Y. Lai; T. Chou; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	Manufacturing Service Creation and Management for Next Generation Virtual Fab	RUEY-SHAN GUO;Y. Lai;T. Chou;S. Chang;Y. Su; RUEY-SHAN GUO; Y. Lai; T. Chou; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	A Self-tuning EWMA Controller for Processes subject to Small and Large Disturbances	J. Chen; RUEY-SHAN GUO; RUEY-SHAN GUO;S. Lu;A. Chen;R. Guo;J. Chen; RUEY-SHAN GUO; S. Lu; A. Chen; R. Guo
臺大學術典藏	2018-09-10T07:10:38Z	A Self-tuning EWMA Controller for Processes subject to Small and Large Disturbances	J. Chen; RUEY-SHAN GUO; RUEY-SHAN GUO;S. Lu;A. Chen;R. Guo;J. Chen; RUEY-SHAN GUO; S. Lu; A. Chen; R. Guo
臺大學術典藏	2018-09-10T07:10:38Z	A Self-tuning EWMA Controller for Processes subject to Small and Large Disturbances	J. Chen; RUEY-SHAN GUO; RUEY-SHAN GUO;S. Lu;A. Chen;R. Guo;J. Chen; RUEY-SHAN GUO; S. Lu; A. Chen; R. Guo
臺大學術典藏	2018-09-10T06:39:20Z	Optimizing Fund Allocation by Considering RAROC	David M. Chiang; Ruey-Shan Guo; Chia-Yin Chen; MING-HUANG CHIANG
臺大學術典藏	2018-09-10T06:39:20Z	Stochastic Modeling and Validation of Inter-Purchase Time for Customer	Ruey-Shan Guo;David M. Chiang;Yi-Fen Chen;Jia-Ying Chen; Ruey-Shan Guo; David M. Chiang; Yi-Fen Chen; Jia-Ying Chen; MING-HUANG CHIANG
臺大學術典藏	2018-09-10T06:39:20Z	Stochastic Modeling and Validation of Inter-Purchase Time for Customer	Ruey-Shan Guo;David M. Chiang;Yi-Fen Chen;Jia-Ying Chen; Ruey-Shan Guo; David M. Chiang; Yi-Fen Chen; Jia-Ying Chen; MING-HUANG CHIANG
臺大學術典藏	2018-09-10T06:39:20Z	The Relationship between Bargaining Power, Vendor Selection Practice and Performance in Semiconductor Supply Chain	Fan-Yun Pai;Ruey-Shan Guo;David M. Chiang; Fan-Yun Pai; Ruey-Shan Guo; David M. Chiang; MING-HUANG CHIANG
臺大學術典藏	2018-09-10T06:39:20Z	The Relationship between Bargaining Power, Vendor Selection Practice and Performance in Semiconductor Supply Chain	Fan-Yun Pai;Ruey-Shan Guo;David M. Chiang; Fan-Yun Pai; Ruey-Shan Guo; David M. Chiang; MING-HUANG CHIANG
臺大學術典藏	2018-09-10T06:39:19Z	A WIP-based exception-management model for integrated circuit back-end production processes"	MING-HUANG CHIANG; RUEY-SHAN GUO; MING-HUANG CHIANG; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:19Z	A WIP-based exception-management model for integrated circuit back-end production processes"	MING-HUANG CHIANG; RUEY-SHAN GUO; MING-HUANG CHIANG; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:19Z	Multi-objectives exception management model for semiconductor back-end environment under turnkey service"	MING-HUANG CHIANG; RUEY-SHAN GUO; MING-HUANG CHIANG; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:19Z	Multi-objectives exception management model for semiconductor back-end environment under turnkey service"	MING-HUANG CHIANG; RUEY-SHAN GUO; MING-HUANG CHIANG; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	Real Competitiveness via Virtual Fab	RUEY-SHAN GUO;T. Chou;Y. Lee;S. Chang;Y. Su; RUEY-SHAN GUO; T. Chou; Y. Lee; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	Real Competitiveness via Virtual Fab	RUEY-SHAN GUO;T. Chou;Y. Lee;S. Chang;Y. Su; RUEY-SHAN GUO; T. Chou; Y. Lee; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	Real Competitiveness via Virtual Fab	RUEY-SHAN GUO;T. Chou;Y. Lee;S. Chang;Y. Su; RUEY-SHAN GUO; T. Chou; Y. Lee; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	An Integrated Wafer Acceptance Test Scheme in Semiconductor Manufacturing	RUEY-SHAN GUO;C. Tsai;J. Fan,;S. Chang; RUEY-SHAN GUO; C. Tsai; J. Fan,; S. Chang; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	An Integrated Wafer Acceptance Test Scheme in Semiconductor Manufacturing	RUEY-SHAN GUO;C. Tsai;J. Fan,;S. Chang; RUEY-SHAN GUO; C. Tsai; J. Fan,; S. Chang; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	An Integrated Wafer Acceptance Test Scheme in Semiconductor Manufacturing	RUEY-SHAN GUO;C. Tsai;J. Fan,;S. Chang; RUEY-SHAN GUO; C. Tsai; J. Fan,; S. Chang; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	An Adaptive Process Controller for Semiconductor Manufacturing	RUEY-SHAN GUO;L. Huang;S. Wang;J. Chen; RUEY-SHAN GUO; L. Huang; S. Wang; J. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	An Adaptive Process Controller for Semiconductor Manufacturing	RUEY-SHAN GUO;L. Huang;S. Wang;J. Chen; RUEY-SHAN GUO; L. Huang; S. Wang; J. Chen; RUEY-SHAN GUO

显示项目 201-225 / 430 (共18页)
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