臺大學術典藏 |
2022-09-21T23:31:07Z |
Power distance diversification, ownership structure, and business group performance
|
Chen, Chung Jen; RUEY-SHAN GUO; Wang, Shan Huei; Lin, Ya Hui |
臺大學術典藏 |
2022-05-20T07:10:48Z |
Strategy, capabilities, and business group performance The endogenous role of industry diversification
|
Wang, Shan-Huei; Chen, Chung-Jen; RUEY-SHAN GUO; Lin, Ya-Hui |
臺大學術典藏 |
2022-04-26T06:17:42Z |
Altruism and social utility in consumer sharing behavior
|
Say A.L;Guo R.-S.A;Chen C.; Say A.L; Guo R.-S.A; Chen C.; RUEY-SHAN GUO |
臺大學術典藏 |
2022-04-26T06:17:41Z |
E-Learning in the Postpandemic Era: A Case Study in Taiwan
|
Lee H;Guo R;Chen C.; Lee H; Guo R; Chen C.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-12-11T03:03:10Z |
Parent-subsidiary linkage: How resource commitment and resource similarity influence firm performance
|
Chen, C.-J.;Lin, Y.-H.;Wang, S.-H.;Guo, R.-S.; Chen, C.-J.; Lin, Y.-H.; Wang, S.-H.; Guo, R.-S.; CHUNG-JEN CHEN; RUEY-SHAN GUO |
臺大學術典藏 |
2020-12-11T03:03:09Z |
Virtual vs physical platform: organizational capacity and slack, strategic decision and firm performance
|
Lee, H.;Hsiao, Y.-C.;Chen, C.-J.;Guo, R.-S.; Lee, H.; Hsiao, Y.-C.; Chen, C.-J.; Guo, R.-S.; CHUNG-JEN CHEN; RUEY-SHAN GUO |
臺大學術典藏 |
2020-11-12T02:51:32Z |
跨境電子商務運輸服務定價策略之研究
|
Ruey-Shan Guo; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:43:12Z |
Decision tree based control chart pattern recognition
|
Wang C.-H.; RUEY-SHAN GUO; MING-HUANG CHIANG; Wong J.-Y. |
臺大學術典藏 |
2020-03-06T03:43:12Z |
Disruption or new order?: The emergence of the unicorn bike-sharing entrepreneurship in China
|
Say A.L.; RUEY-SHAN GUO; CHUNG-JEN CHEN |
臺大學術典藏 |
2020-03-06T03:43:10Z |
A quadratic goal programming model and sensitivity analysis for semiconductor supply chain
|
MING-HUANG CHIANG; RUEY-SHAN GUO; Chen A.; Chen C.-B. |
臺大學術典藏 |
2020-03-06T03:42:44Z |
The D-Day, V-Day, and bleak days of a disruptive technology: A new model for ex-ante evaluation of the timing of technology disruption
|
Chen C.;Zhang J.;Guo R.-S.; Chen C.; Zhang J.; Guo R.-S.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:44Z |
Virtual fab: An enabling framework and dynamic manufacturing service provision mechanism
|
Su Y.-H.; Guo R.-S.; Chang S.-C.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:43Z |
Run-to-run control schemes for CMP process subject to deterministic drifts
|
Guo R.-S.; Chen A.; Chen J.-J.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:43Z |
SHEWMA: an end-of-line SPC scheme using wafer acceptance test data
|
Fan C.-M.; Guo R.-S.; Chang S.-C.; Wei C.-S.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:43Z |
SHEWMAC: An end-of-line SPC scheme for joint monitoring of process mean and variance
|
Fan C.-M.; Chang S.-C.; Guo R.-S.; Kung H.-H.; You J.-C.; Chen H.-P.; Lin S.; Wei J.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:43Z |
SHEWMAC: An end-of-line SPC scheme via exponentially weighted moving statistics
|
Fan C.-M.; Chang S.-C.; Guo R.-S.; Kung H.-H.; You J.-C.; Chen H.-P.; Lin S.; Wei C.-S.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:43Z |
Supply chain inventory control in semiconductor manufacturing
|
Guo R.-S.;Chiang D.;Yang P.-C.; Guo R.-S.; Chiang D.; Yang P.-C.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:42Z |
Partner selection model for design chain collaboration
|
Chen J.-Y.;Chiang D.M.-H.;Guo R.-S.; Chen J.-Y.; Chiang D.M.-H.; Guo R.-S.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:42Z |
Process Control System for VLSI Fabrication
|
Sachs E.; Guo R.-S.; Ha S.; Hu A.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:42Z |
Results of An Implant Masking Integrated Workcall in A Development Facility
|
Griffin R.;Guo R.-S.;Slama M.; Griffin R.; Guo R.-S.; Slama M.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:42Z |
Retailer's optimal sourcing strategy by using one major supplier and one emergent supplier
|
Chiang D.M.;Guo R.-S.;Pai F.-Y.; Chiang D.M.; Guo R.-S.; Pai F.-Y.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:42Z |
Run-To-run control of CMP process considering aging effects of pad and disc
|
Chen A.; Guo R.-S.; Chou Y.L.; Lin C.L.; Dun J.; Wu S.A.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:41Z |
Modeling and optimization of wafer-level spatial uniformity with the use of rational subgrouping
|
Guo R.-S.;Chen A.;Liu C.;Lin A.;Lan M.; Guo R.-S.; Chen A.; Liu C.; Lin A.; Lan M.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:41Z |
Multi-objectives exception management model for semiconductor back-end environment under turnkey service
|
Pai F.-Y.; RUEY-SHAN GUO; Guo R.-S.; Chiang D.M. |
臺大學術典藏 |
2020-03-06T03:42:41Z |
On-line process optimization and control using the sequential design of experiments
|
Sachs E.;Guo R.-S.;Ha S.;Hu A.; Sachs E.; Guo R.-S.; Ha S.; Hu A.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:41Z |
Optimal pricing strategies under co-existence of price-takers and bargainers in a supply chain
|
Kuo C.-W.; Guo R.-S.; Wu Y.-F.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:41Z |
Optimal supply chain configurations in semiconductor manufacturing
|
RUEY-SHAN GUO; Chen C.-B.; Cheng M.-T.; Chen A.; Guo R.-S.; Chiang D. |
臺大學術典藏 |
2020-03-06T03:42:41Z |
Modeling, Optimization and Control of Spatial Uniformity in Manufacturing Processes
|
Guo R.-S.; Guo R.-S.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:40Z |
Forward echelon-based inventory monitoring in semiconductor supply chain
|
Guo R.-S.;Chiang D.;Lin H.-W.;Guo M.-S.; Guo R.-S.; Chiang D.; Lin H.-W.; Guo M.-S.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:40Z |
Function-based cost modeling for wafer manufacturing and its application to strategic management
|
Guo R.-S.;Chen A.;Lin P.-L.;Shih Y.-C.; Guo R.-S.; Chen A.; Lin P.-L.; Shih Y.-C.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:40Z |
How business strategy in non-financial firms moderates the curvilinear effects of corporate social responsibility and irresponsibility on corporate financial performance
|
Chen C.-J.;Guo R.-S.;Hsiao Y.-C.;Chen K.-L.; Chen C.-J.; Guo R.-S.; Hsiao Y.-C.; Chen K.-L.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:40Z |
Improved customer satisfaction with a hybrid dispatching rule in semiconductor back-end factories
|
Chiang D.M.;Guo R.-S.;Pai F.-Y.; Chiang D.M.; Guo R.-S.; Pai F.-Y.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:40Z |
Historically explore on the patterns of business model for silicon Intellectual Property (IP) providers in the semiconductor industry
|
Su Y.-H.;Guo R.-S.;Hsieh W.-Y.; Su Y.-H.; Guo R.-S.; Hsieh W.-Y.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:39Z |
Evolutionary business models and inter-firm engineering processes between the foundry and fabless in the semiconductor industry
|
Guo R.-S.;Su Y.-H.;Chiu S.-F.;Pai F.-Y.;Yeh C.-P.; Guo R.-S.; Su Y.-H.; Chiu S.-F.; Pai F.-Y.; Yeh C.-P.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:39Z |
Evolutionary engineering collaboration for DFM/DFY solutions between foundry and EDA tool vendor
|
Su Y.-H.;Guo R.-S.;Chang H.-H.; Su Y.-H.; Guo R.-S.; Chang H.-H.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:39Z |
First-mover strategy, resource capacity alignment, and new product performance: a framework for mediation and moderation effects
|
Hsiao Y.-C.;Chen C.-J.;Guo R.-S.;Hu K.-K.; Hsiao Y.-C.; Chen C.-J.; Guo R.-S.; Hu K.-K.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:39Z |
Forward echelon-based inventory monitoring in a semiconductor supply Chain
|
Guo R.-S.;Chiang M.-H.;Lin H.-W.;Chen J.-Y.; Guo R.-S.; Chiang M.-H.; Lin H.-W.; Chen J.-Y.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:38Z |
An EWMA-based process mean estimator with dynamic tuning capability
|
Guo R.-S.;Chen J.-J.; Guo R.-S.; Chen J.-J.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:38Z |
Application of dynamic manufacturing service provisioning mechanism to delivery commitment
|
Su Y.-H.;Chang S.-C.;Guo R.-S.;Lai Y.C.; Su Y.-H.; Chang S.-C.; Guo R.-S.; Lai Y.C.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:38Z |
Connected vehicle safety science, system, and framework
|
Yang S.-W.; Chien S.-Y.; Lee C.-H.; Su Y.-C.; Chou C.-T.; Lee Y.-J.; Pao H.-K.; Guo R.-S.; Chen C.-J.; Yang M.-H.; Chen B.-Y.; Hung Y.-P.; RUEY-SHAN GUO; Chen K.-W.;Tsai H.-M.;Hsieh C.-H.;Lin S.-D.;Wang C.-C.;Yang S.-W.;Chien S.-Y.;Lee C.-H.;Su Y.-C.;Chou C.-T.;Lee Y.-J.;Pao H.-K.;Guo R.-S.;Chen C.-J.;Yang M.-H.;Chen B.-Y.;Hung Y.-P.; Chen K.-W.; Tsai H.-M.; Hsieh C.-H.; Lin S.-D.; Wang C.-C. |
臺大學術典藏 |
2020-03-06T03:42:38Z |
Data mining and fault diagnosis based on wafer acceptance test data and in-line manufacturing data
|
Fan C.-M.;Guo R.-S.;Chen A.;Hsu K.-C.;Wei C.-S.; Fan C.-M.; Guo R.-S.; Chen A.; Hsu K.-C.; Wei C.-S.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:37Z |
A real-time equipment monitoring and fault detection system
|
Guo R.S.;Chen A.;Tseng C.L.;Fong I.K.;Yang A.;Lee C.L.;Wu C.H.;Lin S.;Huang S.J.;Lee Y.C.;Chang S.G.;Lee M.Y.; Guo R.S.; Chen A.; Tseng C.L.; Fong I.K.; Yang A.; Lee C.L.; Wu C.H.; Lin S.; Huang S.J.; Lee Y.C.; Chang S.G.; Lee M.Y.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:37Z |
Age-based double EWMA controller and its application to CMP processes
|
Chen A.;Guo R.-S.; Chen A.; Guo R.-S.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:37Z |
Agile Flow Control in Semiconductor Manufacturing: Simulation and Animation Demonstration
|
Guo R.-S.;Griffin R.;Slama M.; Guo R.-S.; Griffin R.; Slama M.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:37Z |
An effective SPC approach to monitoring semiconductor quality data with multiple variation sources
|
Chen A.;Guo R.-S.;Yeh P.-C.; Chen A.; Guo R.-S.; Yeh P.-C.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:37Z |
A self-tuning run-by-run process controller for processes subject to random disturbances
|
Guo R.-S.;Chen J.-J.;Chen A.;Lu S.-S.; Guo R.-S.; Chen J.-J.; Chen A.; Lu S.-S.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:36Z |
A conceptual framework for manufacturing service provisioning by virtual fabs
|
Su Y.-H.;Guo R.-S.;Chang S.-C.; Su Y.-H.; Guo R.-S.; Chang S.-C.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:36Z |
A dynamic binding model for service creation in virtual fab
|
Chang S.C.;Chou T.-L.;Guo R.-S.;Su Y.-H.;Lu L.-L.;Lai I.-C.; Chang S.C.; Chou T.-L.; Guo R.-S.; Su Y.-H.; Lu L.-L.; Lai I.-C.; RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:36Z |
A multi-category inter-purchase time model based on hierarchical Bayesian theory
|
RUEY-SHAN GUO |
臺大學術典藏 |
2020-03-06T03:42:25Z |
A WIP-based exception-management model for integrated circuit back-end production processes
|
RUEY-SHAN GUO; MING-HUANG CHIANG; Pai F.-Y.; MING-HUANG CHIANG |