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Institution	Date	Title	Author
臺大學術典藏	2018-09-10T15:00:12Z	Efficient multi-node optimal placement for decoupling capacitors on PCB	S.-Y. Huang;Y.-S. Cheng;C.-Y. Huang;B. Liu;S. Chang;D. Chiang;P. Gu;R.-B. Wu; S.-Y. Huang; Y.-S. Cheng; C.-Y. Huang; B. Liu; S. Chang; D. Chiang; P. Gu; R.-B. Wu; RUEY-BEEI WU
臺大學術典藏	2018-09-10T08:46:03Z	SI-aware layout and equalizer design to enhance performance of high-speed links in blade servers	Y.-S. Cheng; H.-H. Lu; M. Chang; S. Chang; B. Liu; R.-B. Wu; RUEY-BEEI WU
臺大學術典藏	2018-09-10T07:44:17Z	Network Ready Semiconductor Manufacturing Cluster Tool	RUEY-SHAN GUO;A. Chen;C. Weng;S. Chang;P. Chang;C. Liu;C. Lu;S. Lee,;H. Huang;S. Lu; RUEY-SHAN GUO; A. Chen; C. Weng; S. Chang; P. Chang; C. Liu; C. Lu; S. Lee,; H. Huang; S. Lu; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:40Z	Virtual Fab: A New Business Model for Service-Oriented Foundry Fab	RUEY-SHAN GUO;S. Chang;Y. Su; RUEY-SHAN GUO; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:39Z	An Integrated Fault Detection Scheme for Wafer Acceptance Test Data	RUEY-SHAN GUO;S. Chang;C. Fan; RUEY-SHAN GUO; S. Chang; C. Fan; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	Manufacturing Service Creation and Management for Next Generation Virtual Fab	RUEY-SHAN GUO;Y. Lai;T. Chou;S. Chang;Y. Su; RUEY-SHAN GUO; Y. Lai; T. Chou; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	Real Competitiveness via Virtual Fab	RUEY-SHAN GUO;T. Chou;Y. Lee;S. Chang;Y. Su; RUEY-SHAN GUO; T. Chou; Y. Lee; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	An Integrated Wafer Acceptance Test Scheme in Semiconductor Manufacturing	RUEY-SHAN GUO;C. Tsai;J. Fan,;S. Chang; RUEY-SHAN GUO; C. Tsai; J. Fan,; S. Chang; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	Design and Implementation of an Active Furnace Monitoring System in Semiconductor Manufacturing	RUEY-SHAN GUO;S. Chang;C. Tseng;W. Mao; RUEY-SHAN GUO; S. Chang; C. Tseng; W. Mao; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:04:52Z	Contributions to International Finance Journals by Taiwanese Universities and Colleges	M.W. Hung;S. Chang;Y. Liu; M.W. Hung; S. Chang; Y. Liu; SHU-HSING LI
臺大學術典藏	2018-09-10T06:04:18Z	Intelligent IC Fabrication Diagnosis System	RUEY-SHAN GUO;S. Chang,;J. Lee;C. Tsai;R. Gu; RUEY-SHAN GUO; S. Chang,; J. Lee; C. Tsai; R. Gu; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:04:18Z	End-of-line Quality Control and Abnormal Trend Detection for IC Fabrication	RUEY-SHAN GUO;J. Lee;S. Chang;J. Fan; RUEY-SHAN GUO; J. Lee; S. Chang; J. Fan; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:04:18Z	Fuzzy Logic-based Process Diagnosis Using Water Acceptance Test Data	RUEY-SHAN GUO;S. Chang;J. Lee;C. Tsai; RUEY-SHAN GUO; S. Chang; J. Lee; C. Tsai; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:04:18Z	Abnormal Trend Detection of End-of-line Data Using EWMA Chart	RUEY-SHAN GUO;J. Lee;S. Chang;R. Guo;J. Fan; RUEY-SHAN GUO; J. Lee; S. Chang; R. Guo; J. Fan; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T05:00:39Z	Collaborative Engineering Mechanism between IC Design House and Foundry	RUEY-SHAN GUO;S. Chang;Y. Su; RUEY-SHAN GUO; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T05:00:39Z	Inter-firm Collaboration Mechanism in Process Development and Product Design between Foundry and Fabless Design House	RUEY-SHAN GUO;S. Chang;Y. Su; RUEY-SHAN GUO; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T05:00:39Z	Manufacturing and Engineering Collaboration Mechanism between Foundry and Fabless	RUEY-SHAN GUO;S. Chang;Y. Su; RUEY-SHAN GUO; S. Chang; Y. Su; RUEY-SHAN GUO
南台科技大學	2009	GaN-based LEDs output power improved by textured GaN/sapphire interface using in-situ SiH4 treatment process during epitaxial growth	李明倫; C. M. Tsai; J. K. Sheu; W.C. Lai; M. L. Lee; J. Chang; S. Chang; T. K. Ko; C. F. Shen
義守大學	2008-12	On calculating the time-varying elastance curve of a radial artery using a miniature vibration method	S. Chang; J.-J. Wang; H.-M. Su; C.-P. Liu
國立高雄師範大學	2007	Optical anisotropy in [hkil]-oriented wurtzite semiconductor quantum wells	李孟恩; C. Chen;S. Chang;M. Hung;J. Chiang;I. Lo;Meng-En Lee
高雄醫學大學	2001	利用Fluorescence quenching研究長鍵神經毒素構造之特	張榮賢;林信仁;王志鉦;張均昌; S Chang;SR Lin;JJ Wang;CC Chang
中原大學	1994	Development of SLAM II Based Simulation Testbed for Evaluating Photolithography Area Scheduling/Dispatching Schemes in IC Fabrication	J. Chen;S. Lu;W. Chan;S. Chang;W. Dai;J. C. Chen;

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