English  |  正體中文  |  简体中文  |  2809389  
???header.visitor??? :  26995479    ???header.onlineuser??? :  1402
???header.sponsordeclaration???
 		 
???search.scope??? ???search.advance???
臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
???ui.leftmenu.abouttair???
???ui.leftmenu.explanation???

???ui.leftmenu.bartitle???
Repositories
Author
Title
Date
???ui.leftmenu.statisticschart???
???ui.leftmenu.realtimefacts???
???ui.leftmenu.trend???

???index.news???
2019臺灣學術機構典藏
研討會
機構典藏系統RC7版本已
發佈

???ui.leftmenu.copyrighttitle???
???ui.leftmenu.copyrightpublisher???
???ui.leftmenu.copyrightconference???

???ui.leftmenu.link???
機構典藏計畫網站
ROAR
OpenDOAR
SHERPA
OAIster
JAIRO
Ira
DSPACE
RWWR
臺大學術典藏NTU Scholars
???tair.name??? >  ???browser.page.title.author???

"s w chau"???jsp.browse.items-by-author.description???

???jsp.browse.items-by-author.back???
???jsp.browse.items-by-author.order1??? ???jsp.browse.items-by-author.order2???

Showing items 1-5 of 5  (1 Page(s) Totally)
1 
View [10|25|50] records per page

Institution Date Title Author
臺大學術典藏 2020-05-14T06:59:35Z Numerical simulation of the droplet impinging on a liquid film S.-W. Chau; Wang; A.-B.; AN-BANG WANG
中原大學 2006 Study and Establishment of System Analysis, Design, Manufacturing and Inspection for Micro/Nano Products: Sub-project II - Study on the Multi-scale System Analyses and Simulation Techniques for Micro/Nano Products Tung, K. L.;R. Y. Tsai;S. W. Chau
中原大學 2004 The Fluid Property Dependency on Micro-Fluidic Characteristics in the Deposition Process for Microfabrication S. W. Chau;K. L. Hsu;S. C. Chen;T. M. Liou;K. C. Shih
中原大學 2004 The Fluid Property Dependency on Micro-Fluidic Characteristics in the Deposition Process for Microfabrication S. W. Chau;K. L. Hsu;S. C. Chen;T. M. Liou;K. C. Shih
中原大學 2002 Three-Dimensional Simulations of the Droplet Formation During the Inkjet Printing Process T. M. Liou;K. C. Shih;S. W. Chau;S. C. Chen

Showing items 1-5 of 5  (1 Page(s) Totally)
1 
View [10|25|50] records per page

DSpace Software Copyright © 2002-2004  MIT   &  Hewlett-Packard   /   Enhanced by   NTU Library IR team