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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
國立臺灣大學 2005 Determination of thickness and lattice distortion for the individual layer of strained AlGaN/GaN superlattice by high-angle annular dark-field scanning transmission electron microscopy Shiojiri, M.; Ceh, M.; Sturm, S.; Chuo, C.C.; Hsu, J. T.; Yang, J. R.; Sajio, H.

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