臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

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Institution	Date	Title	Author
臺大學術典藏	2019-07-24T08:47:24Z	Critical angle for irreversible switching of the exchange-bias direction in (formula presented) films	Schneider, C. M.;Schultz, L.;Schäfer, R.;YU-MING CHANG;de Haas, O.;Lin, M. T.; Lin, M. T.; Schafer, R.; Schultz, L.; Schneider, C. M.
臺大學術典藏	2019-07-24T08:47:24Z	Critical angle for irreversible switching of the exchange-bias direction in (formula presented) films	Schneider, C. M.;Schultz, L.;Schäfer, R.;YU-MING CHANG;de Haas, O.;Lin, M. T.; Lin, M. T.; Schafer, R.; Schultz, L.; Schneider, C. M.
臺大學術典藏	2018-09-10T04:30:56Z	Critical angle for irreversible switching of the exchange-bias direction in NiO-Cu-Ni81Fe19 films	de Haas, O.;Schafer, R.;Schultz, L.;Schneider, C. M.;Chang, Y. M.;Lin, M. T.; de Haas, O.; Schafer, R.; Schultz, L.; Schneider, C. M.; Chang, Y. M.; Lin, M. T.; MINN-TSONG LIN
臺大學術典藏	2018-09-10T04:30:56Z	Critical angle for irreversible switching of the exchange-bias direction in NiO-Cu-Ni81Fe19 films	de Haas, O.;Schafer, R.;Schultz, L.;Schneider, C. M.;Chang, Y. M.;Lin, M. T.; de Haas, O.; Schafer, R.; Schultz, L.; Schneider, C. M.; Chang, Y. M.; Lin, M. T.; MINN-TSONG LIN
臺大學術典藏	2002	Magnetic domain imaging of exchange bias system NiO/Cu/NiFe by Kerr microscopy	Chang, Y. M.;Lin, M. T.;Pan, W.;Ho, C. H.;Yao, Y. D.;de Haas, O.;Schafer, R.;Schneider, F. C. M.; Chang, Y. M.; Lin, M. T.; Pan, W.; Ho, C. H.; Yao, Y. D.; de Haas, O.; Schafer, R.; Schneider, F. C. M.; MINN-TSONG LIN
臺大學術典藏	2002	Magnetic domain imaging of exchange bias system NiO/Cu/NiFe by Kerr microscopy	Chang, Y. M.;Lin, M. T.;Pan, W.;Ho, C. H.;Yao, Y. D.;de Haas, O.;Schafer, R.;Schneider, F. C. M.; Chang, Y. M.; Lin, M. T.; Pan, W.; Ho, C. H.; Yao, Y. D.; de Haas, O.; Schafer, R.; Schneider, F. C. M.; MINN-TSONG LIN

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