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Showing items 1-5 of 5 (1 Page(s) Totally)
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| 國立成功大學 |
2016 |
Effects of Non-Stoichiometry on the Microstructure, Oxygen Vacancies, and Electrical Properties of KNN-Based Thin Films
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Weng, Chung-Ming; Tsai, Cheng-Che; Hong, Cheng-Shong; Lin, Chun-Cheng; Chen, Chan-Ching; Chu, Sheng-Yuan; Sheen, Jyh; Chen, Zong-You; Su, Hsiu-Hsien |
| 國立虎尾科技大學 |
2009 |
Microwave measurements of dielectric properties - A further study to a new theoretical model for a closed cylindrical cavity dielectric resonator
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Sheen, Jyh;Chen, Chin-An;Chen, Yi-Hua;Lai, Chin-Lun;Hong, Zuo-Wen |
| 國立虎尾科技大學 |
2008 |
Measurement of microwave dielectric properties by an amended cavity perturbation technique
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Sheen, Jyh |
| 國立虎尾科技大學 |
2008 |
A modified field model of waveguide reflection dielectric resonator for microwave measurements of dielectric properties
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Sheen, Jyh |
| 國立虎尾科技大學 |
2007 |
Microwave Measurements of Dielectric Properties Using a Closed Cylindrical Cavity Dielectric Resonator
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Sheen, Jyh |
Showing items 1-5 of 5 (1 Page(s) Totally)
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