臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

	English \| 正體中文 \| 简体中文 \| Total items :2823024
	Visitors : 30208270 Online Users : 952 Project Commissioned by the Ministry of Education Project Executed by National Taiwan University Library

Scope

Adv. Search

Login

Administrator

臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

About TAIR
	About TAIR

Browse By
	Institution
	Author
	Title
	Date
	Statistics Chart
	Institution Facts
	Trend

News
	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

Copyright
	Publisher & Journal Policy
	TAIR Copyright Conference Minutes

Related Links
	機構典藏計畫網站
	ROAR
	OpenDOAR
	SHERPA
	OAIster
	JAIRO
	Ira
	DSPACE
	RWWR
	臺大學術典藏NTU Scholars

"shie c r"

Return to Browse by Author
Sorting by Title	Sort by Date

Showing items 1-15 of 15 (1 Page(s) Totally)
1
View [10|25|50] records per page

Institution	Date	Title	Author
臺大學術典藏	2020-04-22T07:08:56Z	Roughness-enhanced reliability of MOS tunneling diodes	Lin, C.-H.; Yuan, F.; Shie, C.-R.; Chen, K.-F.; Hsu, B.-C.; Lee, M.H.; Pai, W.W.; Liu, C.W.
臺大學術典藏	2018-09-10T04:33:14Z	Growth and electrical characteristics of liquid-phase deposited SiO2 on Ge	Hsu, B.-C.; Hua, W.-C.; Shie, C.-R.; Chen, K.-F.; Liu, C.W.; CHEE-WEE LIU
臺大學術典藏	2018-09-10T04:33:13Z	Strain-induced growth of SiO2 dots by liquid phase deposition	Liu, C.W.; Hsu, B.-C.; Chen, K.-F.; Lee, M.H.; Shie, C.-R.; Chen, P.-S.; CHEE-WEE LIU
臺大學術典藏	2018-09-10T04:13:01Z	Roughness-enhanced reliability of MOS tunneling diodes	Lin, C.-H.; Yuan, F.; Shie, C.-R.; Chen, K.-F.; Hsu, B.-C.; Lee, M.H.; Pai, W.W.; Liu, C.W.; CHEE-WEE LIU
臺大學術典藏	2018-09-10T04:13:01Z	High efficient 820 nm MOS Ge quantum dot photodetectors for short-reach integrated optical receivers with 1300 and 1550 nm sensitivity	Hsu, B.-C.; Chang, S.T.; Shie, C.-R.; Lai, C.-C.; Chen, P.S.; Liu, C.W.; CHEE-WEE LIU
臺大學術典藏	2018-09-10T04:12:37Z	The band-edge light emission from the metal-oxide-silicon tunneling diode on (1 1 0) substrates	Chang, S. T.; Chen, K.F.; Shie, C. R.; Liu, C. W.; Chen, Miin-Jang; Lin, Ching-Fuh; CHING-FUH LIN; CHEE-WEE LIU; Chen, Miin-Jang
臺大學術典藏	2018-09-10T03:48:04Z	Oxide roughness enhanced reliability of MOS tunneling diodes	Lin, C.-H.; Lee, M.H.; Hsu, B.-C.; Chen, K.-F.; Shie, C.-R.; Liu, C.W.; CHEE-WEE LIU
國立臺灣大學	2003	Growth and Electrical Characteristics of Liquid-Phase Deposited SiO2 on Ge	Hsu, B.-C.; Hua, W.-C.; Shie, C.-R.; Chen, K.-F.; Liu, C. W.
國立臺灣大學	2003	Strain-induced growth of SiO2 dots by liquid phase deposition	Liu, C. W.; Hsu, B.-C.; Chen, K.-F.; Lee, M. H.; Shie, C.-R.; Chen, Pang-Shiu
臺大學術典藏	2003	Strain-induced growth of SiO2 dots by liquid phase deposition	Shie, C.-R.; Chen, Pang-Shiu; LiuCW; Lee, M. H.; Chen, K.-F.; Hsu, B.-C.; Liu, C. W.; Liu, C. W.; Hsu, B.-C.; Chen, K.-F.; Lee, M. H.; Shie, C.-R.; Chen, Pang-Shiu
國立臺灣大學	2002-12	High efficient 820 nm MOS Ge quantum dot photodetectors for short-reach integrated optical receivers with 1300 and 1550 nm sensitivity	Hsu, B.C.; Chang, S.T.; Shie, C.R.; Lai, C.C.; Chen, P.S.; Liu, C.W.
國立臺灣大學	2002-08	The band-edge light emission from the metal-oxide-silicon tunneling diode on (110) substrates	Chang, S. T.; Chen, K.F.; Shie, C. R.; Liu, C. W.; Chen, Miin-Jang; Lin, Ching-Fuh
國立臺灣大學	2002	The band-edge light emission from the metal-oxide-silicon tunneling diode on (1 1 0) substrates	Chang, S. T.; Chen, K. F.; Shie, C. R.; Liu, C. W.; Chen, Miin-Jang; Lin, Ching-Fuh
國立臺灣大學	2002	Roughness- Enhanced Reliability of MOS Tunneling Diodes	Lin, C.-H.; Yuan, F.; Shie, C.-R.; Chen, K.-F.; Hsu, B.-C.; Lee, M.H.; Pai, W.W.; Liu, C.W.
國立臺灣大學	2001-12	Oxide roughness enhanced reliability of MOS tunneling diodes	Lin, C.H.; Lee, M.H.; Hsu, B.C.; Chen, K.F.; Shie, C.R.; Liu, C.W.

Showing items 1-15 of 15 (1 Page(s) Totally)
1
View [10|25|50] records per page