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Showing items 1-7 of 7 (1 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:45:19Z |
Retardation in the chemical-mechanical polish of the boron-doped polysilicon and silicon
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Yang, WL; Cheng, CY; Tsai, MS; Liu, DG; Shieh, MS |
| 國立交通大學 |
2014-12-08T15:45:12Z |
Improvement of polysilicon oxide integrity using NF3-annealing
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Yang, WL; Shieh, MS; Chen, YM; Chao, TS; Liu, DG; Lei, TF |
| 國立交通大學 |
2014-12-08T15:18:42Z |
Characterization of polysilicon thin-film transistors with asymmetric source/drain implantation
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Shieh, MS; Lin, YJ; Yu, CM; Lei, TF |
| 國立交通大學 |
2014-12-08T15:18:21Z |
A novel dynamic threshold voltage MOSFET (DTMOS) using heterostructure channel of Si1-yCy interlayer
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Shieh, MS; Chen, PS; Tsai, MJ; Lei, TF |
| 國立交通大學 |
2014-12-08T15:17:43Z |
The CMP process and cleaning solution for planarization of strain-relaxed SiGe virtual substrates in MOSFET applications
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Shieh, MS; Chen, PS; Tsai, MJ; Lei, TF |
| 國立交通大學 |
2014-12-08T15:16:57Z |
Electrical characteristics and reliability of multi-channel polycrystalline silicon thin-film transistors
|
Shieh, MS; Sang, JY; Chen, CY; Wang, SD; Lei, TF |
| 國立交通大學 |
2014-12-08T15:06:32Z |
ANALYSIS OF NUCLEAR-REACTOR SYSTEMS BY USE OF INTEGRATION METHOD
|
SHIEH, MS; HAN, KW |
Showing items 1-7 of 7 (1 Page(s) Totally)
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