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Institution Date Title Author
國立交通大學 2014-12-08T15:25:32Z ESD protection structure with embedded high-voltage p-type SCR for automotive vacuum-fluorescent-display (VFD) applications Ker, MD; Chang, WJ; Yang, M; Chen, CC; Chan, MC; Shieh, WT; Yen, KL
義守大學 2009-12 New Ballasting Layout Schemes to Improve ESD Robustness of I/O Buffers in Fully Silicided CMOS Process Ker MD;Chen WY;Shieh WT;Wei IJ

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