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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
國立成功大學 2020-12 Suppression of Edge Effect Induced by Positive Gate Bias Stress in Low-Temperature Polycrystalline Silicon TFTs With Channel Width Extension Over Source/Drain Regions Wang;Yu-Xuan;Tai;Mao-Chou;Chang;Ting-Chang;Huang;Shin-Ping;Zheng;Yu-Zhe;Wu;Chia-Chuan;Shih;Yu-Shan;Chen;Yu-An;Sun;Pei-Jun;Lu;I-Nien;Huang;Hui-Chun;Sze;Simon, M.
國立成功大學 2019-12 Formation of Hump Effect Due to Top-Gate Bias Stress in Organic Thin-Film Transistors Chen;Hong-Chih;Chen;Guan-Fu;Huang;Shin-Ping;Chang;Ting-Chang;Chen;Po-Hsun;Chen;Jian-Jie;Kuo;Chuan-Wei;Zhou;Kuan-Ju;Hung;Yang-Hao;Tsao;Yu-Ching;Chu;An-Kuo;Huang;Hui-Chun;Lai;Wei-Chih
國立成功大學 2019-10-30 Investigation of the Capacitance-Voltage Electrical Characteristics of Thin-Film Transistors Caused by Hydrogen Diffusion under Negative Bias Stress in a Moist Environment Chen;Hong-Chih;Kuo;Chuan-Wei;Chang;Ting-Chang;Lai;Wei-Chih;Chen;Po-Hsun;Chen;Guan-Fu;Huang;Shin-Ping;Chen;Jian-Jie;Zhou;Kuan-Ju;Shih;Chih-Cheng;Tsao;Yu-Ching;Huang;Hui-Chun;Sze;Simon, M.
國立成功大學 2019-09 A Novel Heat Dissipation Structure for Inhibiting Hydrogen Diffusion in Top-Gate a-InGaZnO TFTs Chen;Hong-Chih;Chen;Guan-Fu;Chen;Po-Hsun;Huang;Shin-Ping;Chen;Jian-Jie;Zhou;Kuan-Ju;Kuo;Chuan-Wei;Tsao;Yu-Ching;Chu;An-Kuo;Huang;Hui-Chun;Lai;Wei-Chih;Chang;Ting-Chang
國立成功大學 2019-08 Abnormal Unsaturated Output Characteristics In a-InGaZnO TFTs With Light Shielding Layer Chen;Hong-Chih;Zhou;Kuan-Ju;Chen;Po-Hsun;Chen;Guan-Fu;Huang;Shin-Ping;Chen;Jian-Jie;Kuo;Chuan-Wei;Tsao;Yu-Ching;Tai;Mao-Chou;Chu;An-Kuo;Lai;Wei-Chih;Chang;Ting-Chang
國立成功大學 2019-06 An Energy-Band Model for Dual-Gate-Voltage Sweeping in Hydrogenated Amorphous Silicon Thin-Film Transistors Chen;Guan-Fu;Chen;Hong-Chih;Chang;Ting-Chang;Huang;Shin-Ping;Chen;Hua-Mao;Liao;Po-Yung;Chen;Jian-Jie;Kuo;Chuan-Wei;Lai;Wei-Chih;Chu;Ann-Kuo;Lin;Sung-Chun;Yeh;Cheng-Yen;Chang;Chia-Sen;Tsai;Cheng-Ming;Yu;Ming-Chang;Zhang;Shengdong

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