臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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	Repositories
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	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

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Institution	Date	Title	Author
國立臺灣科技大學	2014	Electrical test method of open defects at data buses in 3D SRAM IC	Shiraishi Y., Hashizume M., Yotsuyanagi H., Tada T., Lu S.-K.

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