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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
國立交通大學 2019-08-02T02:15:26Z The effect of hydrogen on programmed threshold-voltage distribution in NAND flash memories Chiu, Yung-Yueh; Lin, Cheng-Han; Yang, Jhih-Siang; Yang, Bo-Jun; Aoki, Minoru; Takeshita, Toshiaki; Yano, Masaru; Shirota, Riichiro
國立交通大學 2019-04-03T06:39:55Z Impact of String Pattern on the Threshold-Voltage Spread of Program-Inhibited Cell in NAND Flash Chiu, Yung-Yueh; Aoki, Minoru; Yano, Masaru; Shirota, Riichiro
國立交通大學 2019-04-02T05:58:58Z Transconductance Distribution in Program/Erase Cycling of NAND Flash Memory Devices: a Statistical Investigation Chiu, Yung-Yueh; Lin, I-Chun; Chang, Kai-Chieh; Yang, Bo-Jun; Takeshita, Toshiaki; Yano, Masaru; Shirota, Riichiro
國立交通大學 2018-08-21T05:53:13Z Evaluation of the Role of Deep Trap State Using Analytical Model in the Program/Erase Cycling of NAND Flash Memory and Its Process Dependence Yang, Bo-Jun; Wu, Yu-Ting; Chiu, Yung-Yueh; Kuo, Tse-Mien; Chang, Jung-Ho; Wang, Pin-Yao; Shirota, Riichiro
國立交通大學 2015-12-02T02:59:29Z Characterization of the charge trapping properties in p-channel silicon-oxide-nitride-oxide-silicon memory devices including SiO2/Si3N4 interfacial transition layer Chiu, Yung-Yueh; Yang, Bo-Jun; Li, Fu-Hai; Chang, Ru-Wei; Sun, Wein-Town; Lo, Chun-Yuan; Hsu, Chia-Jung; Kuo, Chao-Wei; Shirota, Riichiro
國立交通大學 2015-07-21T08:29:05Z New Method to Analyze the Shift of Floating Gate Charge and Generated Tunnel Oxide Trapped Charge Profile in NAND Flash Memory by Program/Erase Endurance Shirota, Riichiro; Yang, Bo-Jun; Chiu, Yung-Yueh; Chen, Hsuan-Tse; Ng, Seng-Fei; Wang, Pin-Yao; Chang, Jung-Ho; Kurachi, Ikuo
國立交通大學 2014-12-16T06:15:02Z APPLICATION CIRCUIT AND OPERATION METHOD OF SEMICONDUCTOR DEVICE Shirota Riichiro; Watanabe Hiroshi
國立交通大學 2014-12-12T02:37:48Z 探討P 型 SONOS 快閃記憶體元件抹寫週期忍耐度 之研究 張如薇; Chang, Ru-Wei; 白田理一郎; Shirota, Riichiro
國立交通大學 2014-12-12T02:36:08Z 非揮發性快閃記憶體元件電荷分佈與可靠度之探討 李富海; Li, Fu-Hai; 白田理一郎; Shirota, Riichiro
國立交通大學 2014-12-12T02:35:58Z 非揮發性快閃記憶體新式寫入序列方法之研究 毛妮娜; Mitiukhina Nina; 白田理一郎; Shirota Riichiro

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