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"shirota riichiro"???jsp.browse.items-by-author.description???
Showing items 11-15 of 15 (1 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:31:35Z |
Study Trapped Charge Distribution in P-Channel Silicon-Oxide-Nitride-Oxide-Silicon Memory Device Using Dynamic Programming Scheme
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Li, Fu-Hai; Chiu, Yung-Yueh; Lee, Yen-Hui; Chang, Ru-Wei; Yang, Bo-Jun; Sun, Wein-Town; Lee, Eric; Kuo, Chao-Wei; Shirota, Riichiro |
| 國立交通大學 |
2014-12-08T15:31:14Z |
Impact of Source/Drain Junction and Cell Shape on Random Telegraph Noise in NAND Flash Memory
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Li, Fu-Hai; Shirota, Riichiro |
| 國立交通大學 |
2014-12-08T15:24:12Z |
A New Programming Scheme for the Improvement of Program Disturb Characteristics in Scaled NAND Flash Memory
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Shirota, Riichiro; Huang, Chen-Hao; Nagai, Shinji; Sakamoto, Yoshinori; Li, Fu-Hai; Mitiukhina, Nina; Arakawa, Hideki |
| 國立交通大學 |
2014-12-08T15:21:19Z |
A New Disturb Free Programming Scheme in Scaled NAND Flash Memory
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Shirota, Riichiro; Huang, Chen-Hao; Arakawa, Hideki |
| 國立交通大學 |
2014-12-08T15:20:40Z |
Analysis of the Correlation Between the Programmed Threshold-Voltage Distribution Spread of NAND Flash Memory Devices and Floating-Gate Impurity Concentration
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Shirota, Riichiro; Sakamoto, Yoshinori; Hsueh, Hung-Ming; Jaw, Jian-Ming; Chao, Wen-Chuan; Chao, Chih-Ming; Yang, Sheng-Fu; Arakawa, Hideki |
Showing items 11-15 of 15 (1 Page(s) Totally)
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