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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
元智大學 Oct-20 Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing Shu-Kai S. Fan; Chia-Yu Hsu; Du-Ming Tsai; Fei He; Chun-Chung Cheng
元智大學 May-23 Effective Variational-Autoencoder-Based Generative Models for Highly Imbalanced Fault Detection Data in Semiconductor Manufacturing Shu-Kai S. Fan; Du-Ming Tsai; Pei-Chi Yeh
元智大學 May-22 Data Visualization of Anomaly Detection in Semiconductor Processing Tools Shu-Kai S. Fan; Du-Ming Tsai; Chih-Hung Jen; Chia-Yu Hsu; Fei He; Li-Ting Juan
元智大學 Mar-18 Special issue for the "Asia Pacific Industrial Engineering and Management Systems (APIEMS) 2016 Conference'' PREFACE Shu-Kai S. Fan; Ching-Jung Ting
元智大學 Jun-21 Auto-Annotated Deep Segmentation for Surface Defect Detection Du-Ming Tsai; Shu-Kai S. Fan; Yi-Hsiang Chou
元智大學 Jul-22 Key Feature Identification for Monitoring Wafer-to-Wafer Variation in Semiconductor Manufacturing Shu-Kai S. Fan; Chia-Yu Hsu; Du-Ming Tsai; Mabel C. Chou; Chih-Hung Jen; Jen-Hsuan Tsou
元智大學 Jul-19 Key parameter identification and defective wafer detection of semiconductor manufacturing processes using image processing techniques Shu-Kai S. Fan; Du-Ming Tsai; Fei He; Jui-Yu Huang; Chih-Hung Jen
元智大學 Apr-17 Automatic vision-based grain optimization and analysis of multi-crystalline solar wafers using hierarchical region growing Shu-Kai S. Fan; Du-Ming Tsai; Wei-Che Chuang
元智大學 Apr-17 Using machine learning and big data approaches to predict travel time based on historical and real-time data from Taiwan electronic toll collection Shu-Kai S. Fan; Chuan Jun Su; Han-Tang Nien; Pei-Fang Tsai; Chen-Yang Cheng
元智大學 Apr-17 Automatic vision-based grain optimization and analysis of multi-crystalline solar wafers using hierarchical region growing Shu-Kai S. Fan; Du-Ming Tsai; Wei-Che Chuang
元智大學 Apr-17 Using machine learning and big data approaches to predict travel time based on historical and real-time data from Taiwan electronic toll collection Shu-Kai S. Fan; Chuan Jun Su; Han-Tang Nien; Pei-Fang Tsai; Chen-Yang Cheng
元智大學 Apr-17 Using machine learning and big data approaches to predict travel time based on historical and real-time data from Taiwan electronic toll collection Shu-Kai S. Fan; Chuan Jun Su; Han-Tang Nien; Pei-Fang Tsai; Chen-Yang Cheng
元智大學 Apr-17 Using machine learning and big data approaches to predict travel time based on historical and real-time data from Taiwan electronic toll collection Shu-Kai S. Fan; Chuan Jun Su; Han-Tang Nien; Pei-Fang Tsai; Chen-Yang Cheng
元智大學 Apr-17 Using machine learning and big data approaches to predict travel time based on historical and real-time data from Taiwan electronic toll collection Shu-Kai S. Fan; Chuan Jun Su; Han-Tang Nien; Pei-Fang Tsai; Chen-Yang Cheng
元智大學 Apr-17 Using machine learning and big data approaches to predict travel time based on historical and real-time data from Taiwan electronic toll collection Shu-Kai S. Fan; Chuan Jun Su; Han-Tang Nien; Pei-Fang Tsai; Chen-Yang Cheng
元智大學 2018-05-20 Key Parameter Identification for Faulty Wafer Detection Using Image Processing Shu-Kai S. Fan; Du-Ming Tsai; Chih-Hung Jen; Rui-Yu Huang; Kuan-Lung Chen
元智大學 2012-04 Prediction of time-varying metrology delay for dEWMA and RLS-LT controllers Shu-Kai S. Fan; Le-Chun Lo; Yuan-Jung Chang; Chen-ju Lin; Fugee Tsung

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