臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
元智大學	Oct-20	Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing	Shu-Kai S. Fan; Chia-Yu Hsu; Du-Ming Tsai; Fei He; Chun-Chung Cheng
元智大學	May-23	Effective Variational-Autoencoder-Based Generative Models for Highly Imbalanced Fault Detection Data in Semiconductor Manufacturing	Shu-Kai S. Fan; Du-Ming Tsai; Pei-Chi Yeh
元智大學	May-22	Data Visualization of Anomaly Detection in Semiconductor Processing Tools	Shu-Kai S. Fan; Du-Ming Tsai; Chih-Hung Jen; Chia-Yu Hsu; Fei He; Li-Ting Juan
元智大學	Mar-18	Special issue for the "Asia Pacific Industrial Engineering and Management Systems (APIEMS) 2016 Conference'' PREFACE	Shu-Kai S. Fan; Ching-Jung Ting
元智大學	Jun-21	Auto-Annotated Deep Segmentation for Surface Defect Detection	Du-Ming Tsai; Shu-Kai S. Fan; Yi-Hsiang Chou
元智大學	Jul-22	Key Feature Identification for Monitoring Wafer-to-Wafer Variation in Semiconductor Manufacturing	Shu-Kai S. Fan; Chia-Yu Hsu; Du-Ming Tsai; Mabel C. Chou; Chih-Hung Jen; Jen-Hsuan Tsou
元智大學	Jul-19	Key parameter identification and defective wafer detection of semiconductor manufacturing processes using image processing techniques	Shu-Kai S. Fan; Du-Ming Tsai; Fei He; Jui-Yu Huang; Chih-Hung Jen
元智大學	Apr-17	Automatic vision-based grain optimization and analysis of multi-crystalline solar wafers using hierarchical region growing	Shu-Kai S. Fan; Du-Ming Tsai; Wei-Che Chuang
元智大學	Apr-17	Using machine learning and big data approaches to predict travel time based on historical and real-time data from Taiwan electronic toll collection	Shu-Kai S. Fan; Chuan Jun Su; Han-Tang Nien; Pei-Fang Tsai; Chen-Yang Cheng
元智大學	Apr-17	Automatic vision-based grain optimization and analysis of multi-crystalline solar wafers using hierarchical region growing	Shu-Kai S. Fan; Du-Ming Tsai; Wei-Che Chuang

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