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Institution Date Title Author
臺大學術典藏 2018-09-10T09:50:56Z Automatic Test Pattern Generation for Delay Defects Using Timed Characteristic Functions Shin-Yann Ho;Shuo-Ren Lin;Ko-Lung Yuan;Chien-Yen Kuo;Kuan-Yu Liao;Jie-Hong R. Jiang;Chien-Mo James Li; Shin-Yann Ho; Shuo-Ren Lin; Ko-Lung Yuan; Chien-Yen Kuo; Kuan-Yu Liao; Jie-Hong R. Jiang; Chien-Mo James Li; JIE-HONG JIANG
臺大學術典藏 2018-09-10T09:50:56Z Automatic Test Pattern Generation for Delay Defects Using Timed Characteristic Functions Shin-Yann Ho;Shuo-Ren Lin;Ko-Lung Yuan;Chien-Yen Kuo;Kuan-Yu Liao;Jie-Hong R. Jiang;Chien-Mo James Li; Shin-Yann Ho; Shuo-Ren Lin; Ko-Lung Yuan; Chien-Yen Kuo; Kuan-Yu Liao; Jie-Hong R. Jiang; Chien-Mo James Li; JIE-HONG JIANG
臺大學術典藏 2018-09-10T09:50:55Z Software Workarounds for Hardware Errors: Instruction Patch Synthesis Tsung-Po Liu;Shuo-Ren Lin;Jie-Hong R. Jiang; Tsung-Po Liu; Shuo-Ren Lin; Jie-Hong R. Jiang; JIE-HONG JIANG
臺大學術典藏 2018-09-10T09:50:55Z Software Workarounds for Hardware Errors: Instruction Patch Synthesis Tsung-Po Liu;Shuo-Ren Lin;Jie-Hong R. Jiang; Tsung-Po Liu; Shuo-Ren Lin; Jie-Hong R. Jiang; JIE-HONG JIANG
臺大學術典藏 2018-09-10T09:50:54Z Automatic Test Pattern Generation for Delay Defects Using Timed Characteristic Functions Shin-Yann Ho;Shuo-Ren Lin;Ko-Lung Yuan;Chien-Yen Kuo;Kuan-Yu Liao;Jie-Hong Rol Jiang;Chien-Mo Li; Shin-Yann Ho; Shuo-Ren Lin; Ko-Lung Yuan; Chien-Yen Kuo; Kuan-Yu Liao; Jie-Hong Rol Jiang; Chien-Mo Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T09:50:54Z Automatic Test Pattern Generation for Delay Defects Using Timed Characteristic Functions Shin-Yann Ho;Shuo-Ren Lin;Ko-Lung Yuan;Chien-Yen Kuo;Kuan-Yu Liao;Jie-Hong Rol Jiang;Chien-Mo Li; Shin-Yann Ho; Shuo-Ren Lin; Ko-Lung Yuan; Chien-Yen Kuo; Kuan-Yu Liao; Jie-Hong Rol Jiang; Chien-Mo Li; CHIEN-MO LI

Showing items 1-6 of 6  (1 Page(s) Totally)
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