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Showing items 1-4 of 4 (1 Page(s) Totally)
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| 國立臺灣大學 |
1988 |
Analysis of Valence Shell Electronic Excitations in Si and Its Refractory Compounds Using Electron Energy Loss Microspectroscopy
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Skiff, W. M.; Carpenter, R. W.; 林聖賢; Skiff, W. M.; Carpenter, R. W.; Lin, Sheng-Hsien |
| 國立臺灣大學 |
1988 |
K,L,M,N,O and P Ionization Cross Sections for Electron Energy Loss Spectroscopy
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Skiff, W. M.; Carpenter, R. W.; 林聖賢; Skiff, W. M.; Carpenter, R. W.; Lin, Sheng-Hsien |
| 國立臺灣大學 |
1987 |
Near-edge Fine Structure Analysis of Core Shell Electronic Absorption Edges in Si and Its Refractory Compounds Using Electron Energy Loss Microscopy
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Skiff, W. M.; Carpenter, R. W.; 林聖賢; Skiff, W. M.; Carpenter, R. W.; Lin, Sheng-Hsien |
| 國立臺灣大學 |
1985 |
SiL Core Edge Fine Structure in an Oxidation Series of Silicon Compounds:a Comparison of Micro Electron Energy Loss Spectra with Theory
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Skiff, W. M.; Carpenter, R. W.; 林聖賢; Skiff, W. M.; Carpenter, R. W.; Lin, Sheng-Hsien |
Showing items 1-4 of 4 (1 Page(s) Totally)
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