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"stetsko y p"
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| 臺大學術典藏 |
2019-12-27T07:49:48Z |
Measuring interface strains at the atomic resolution in depth using x-ray Bragg-surface diffraction
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Sun, W.C.; Chang, H.C.; Wu, B.K.; Chen, Y.R.; Chu, C.H.; Chang, S.L.; Hong, M.; Tang, M.T.; Stetsko, Y.P.; MINGHWEI HONG |
| 淡江大學 |
2004-12-30 |
Direct measurement of spatial distortions of charge density waves in K0.3MoO3
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杜昭宏; Du, Chao-hung; Tang, M. T.; Stetsko, Y. P.; Lee, Y. R.; Lo, C. Y.; Lee, J. J.; Lin, H. H.; Chang, S. L. |
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