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Showing items 36-37 of 37  (4 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-12T01:13:41Z 一種改良的介面缺陷之橫向剖面分析應用於奈米級應變矽CMOS元件之可靠度探討 謝易叡; E Ray Hsieh; 莊紹勳; Steve S. Chung
國立交通大學 2014-12-12T01:13:04Z 低電壓且高速操作的P通道快閃式記憶體元件性能及可靠性研究 黃耀賢; Yao-Hsien Huang; 莊紹勳; Steve S. Chung

Showing items 36-37 of 37  (4 Page(s) Totally)
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