|
|
Taiwan Academic Institutional Repository >
Browse by Author
|
"su cc"
Showing items 21-30 of 80 (8 Page(s) Totally)
<< < 1 2 3 4 5 6 7 8 > >>
View [10|25|50] records per page
| 國立交通大學 |
2014-12-08T15:44:22Z |
Fault diagnosis for linear analog circuits
|
Lin, JW; Lee, CL; Su, CC; Chen, JE |
| 國立交通大學 |
2014-12-08T15:42:51Z |
Analysis of application of the IDDQ technique to the deep sub-micron VLSI testing
|
Lu, CW; Lee, CL; Su, CC; Chen, JE |
| 國立交通大學 |
2014-12-08T15:27:20Z |
A new IDDQ testing scheme employing charge storage BICS circuit for deep submicron CMOS ULSI
|
Lu, CW; Lee, CL; Chen, JE; Su, CC |
| 國立交通大學 |
2014-12-08T15:27:06Z |
Fault diagnosis for linear analog circuits
|
Lin, JW; Lee, CL; Su, CC; Chen, JE |
| 國立交通大學 |
2014-12-08T15:27:01Z |
A methodology for fault model development for hierarchical linear systems
|
Huang, YC; Lee, CL; Lin, JW; Chen, JE; Su, CC |
| 國立交通大學 |
2014-12-08T15:26:11Z |
A novel LCD driver testing technique using logic test channels
|
Su, CC; Wang, WJ; Wang, CH; Tseng, IS |
| 國立交通大學 |
2014-12-08T15:25:55Z |
Windowed multicarrier systems with minimum spectral leakage
|
Lin, YP; Jian, YY; Su, CC; Phoong, SM |
| 國立交通大學 |
2014-12-08T15:25:45Z |
A unified approach to detecting crosstalk faults of interconnects in deep submicron VLSI
|
Li, KSM; Lee, CL; Su, CC; Chen, JE |
| 國立交通大學 |
2014-12-08T15:25:45Z |
Dynamic analog testing via ATE digital test channels
|
Su, CC; Chang, CS; Huang, HW; Tu, DS; Lee, CL; Lin, JCH |
| 國立交通大學 |
2014-12-08T15:25:44Z |
A digital LVDS driver with simultaneous switching noise rejection
|
Wang, HW; Lu, HW; Su, CC |
Showing items 21-30 of 80 (8 Page(s) Totally)
<< < 1 2 3 4 5 6 7 8 > >>
View [10|25|50] records per page
|
