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Showing items 51-60 of 123 (13 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:19:28Z |
Effective approaches for low temperature polysilicon TFT LCD post-mapping yield control problem
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Su, CT; Wang, PS; Hsu, CC |
| 國立交通大學 |
2014-12-08T15:19:20Z |
Correlation and the time interval in multiple regression models
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Jea, R; Lin, JL; Su, CT |
| 國立交通大學 |
2014-12-08T15:18:52Z |
The implementation of an activity-based costing collaborative planning system for semiconductor backend production
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Hsu, HP; Su, CT |
| 國立交通大學 |
2014-12-08T15:18:49Z |
Data transformation in SPC for semiconductor machinery control: A case of monitoring particles
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Chen, MC; Su, CT; Hsu, CC; Liu, YW |
| 國立交通大學 |
2014-12-08T15:18:05Z |
Time aggregation effect on the correlation coefficient: added-systematically sampled framework
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Jea, R; Su, CT; Lin, JL |
| 國立交通大學 |
2014-12-08T15:17:31Z |
An optimal yield mapping approach for the small and medium sized liquid crystal displays
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Wang, PS; Su, CT |
| 國立交通大學 |
2014-12-08T15:16:58Z |
Precision parameter in the variable precision rough sets model: an application
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Su, CT; Hsu, JH |
| 國立交通大學 |
2014-12-08T15:16:27Z |
A neural network based information granulation approach to shorten the cellular phone test process
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Su, CT; Chen, LS; Chiang, TL |
| 國立交通大學 |
2014-12-08T15:15:41Z |
Knowledge acquisition through information granulation for imbalanced data
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Su, CT; Chen, LS; Yih, YW |
| 國立交通大學 |
2014-12-08T15:03:16Z |
A COMPARISON OF STATISTICAL REGRESSION AND NEURAL-NETWORK METHODS IN MODELING MEASUREMENT ERRORS FOR COMPUTER VISION INSPECTION SYSTEMS
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CHANG, CA; SU, CT |
Showing items 51-60 of 123 (13 Page(s) Totally)
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